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Title: APT mass spectrometry and SEM data for CdTe solar cells

Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl 2 treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl 2-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. As a result, these data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.
 [1] ;  [2] ;  [2] ;  [3] ;  [4] ;  [4]
  1. Univ. of Vienna, Vienna (Austria)
  2. Univ. of Toledo, Toledo, OH (United States)
  3. National Univ. of Singapore (Singapore)
  4. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Grant/Contract Number:
AC05-00OR22725; FOA-0000492
Published Article
Journal Name:
Data in Brief
Additional Journal Information:
Journal Volume: 7; Journal Issue: C; Journal ID: ISSN 2352-3409
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC); USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Country of Publication:
United States
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; scanning electron microscopy; atom probe tomography; mass spectroscopy; solar cells
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1261322