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Title: Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging

Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [1] ;  [1] ;  [4] ;  [5] ;  [4] ;  [2] ;  [2] ;  [1]
  1. Fraunhofer Institute for Solar Energy Systems, Heidenhofstraβe 2, D-79110 Freiburg, Germany
  2. Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
  3. Department of Materials Science and Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 136-713, South Korea
  4. FUTURE-PV Innovation, Koriyama, Fukushima 963-0215, Japan
  5. Kyoto University, Yoshida-Honmachi, Sakyo-Ku, Kyoto 606-8501, Japan
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 120 Journal Issue: 10; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1322422

Schön, Jonas, Youssef, Amanda, Park, Sungeun, Mundt, Laura E., Niewelt, Tim, Mack, Sebastian, Nakajima, Kazuo, Morishita, Kohei, Murai, Ryota, Jensen, Mallory A., Buonassisi, Tonio, and Schubert, Martin C.. Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging. United States: N. p., Web. doi:10.1063/1.4961465.
Schön, Jonas, Youssef, Amanda, Park, Sungeun, Mundt, Laura E., Niewelt, Tim, Mack, Sebastian, Nakajima, Kazuo, Morishita, Kohei, Murai, Ryota, Jensen, Mallory A., Buonassisi, Tonio, & Schubert, Martin C.. Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging. United States. doi:10.1063/1.4961465.
Schön, Jonas, Youssef, Amanda, Park, Sungeun, Mundt, Laura E., Niewelt, Tim, Mack, Sebastian, Nakajima, Kazuo, Morishita, Kohei, Murai, Ryota, Jensen, Mallory A., Buonassisi, Tonio, and Schubert, Martin C.. 2016. "Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging". United States. doi:10.1063/1.4961465.
@article{osti_1322422,
title = {Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging},
author = {Schön, Jonas and Youssef, Amanda and Park, Sungeun and Mundt, Laura E. and Niewelt, Tim and Mack, Sebastian and Nakajima, Kazuo and Morishita, Kohei and Murai, Ryota and Jensen, Mallory A. and Buonassisi, Tonio and Schubert, Martin C.},
abstractNote = {},
doi = {10.1063/1.4961465},
journal = {Journal of Applied Physics},
number = 10,
volume = 120,
place = {United States},
year = {2016},
month = {9}
}