Determination of crystal growth rates during rapid solidification of polycrystalline aluminum by nano-scale spatio-temporal resolution in situ transmission electron microscopy
Abstract
In situ investigations of rapid solidification in polycrystalline Al thin films were conducted using nano-scale spatio-temporal resolution dynamic transmission electron microscopy. Differences in crystal growth rates and asymmetries in melt pool development were observed as the heat extraction geometry was varied by controlling the proximity of the laser-pulse irradiation and the associated induced melt pools to the edge of the transmission electron microscopy support grid, which acts as a large heat sink. Experimental parameters have been established to maximize the reproducibility of the material response to the laser-pulse-related heating and to ensure that observations of the dynamical behavior of the metal are free from artifacts, leading to accurate interpretations and quantifiable measurements with improved precision. Interface migration rate measurements revealed solidification velocities that increased consistently from ~1.3 m s–1 to ~2.5 m s–1 during the rapid solidification process of the Al thin films. Under the influence of an additional large heat sink, increased crystal growth rates as high as 3.3 m s–1 have been measured. The in situ experiments also provided evidence for development of a partially melted, two-phase region prior to the onset of rapid solidification facilitated crystal growth. As a result, using the experimental observations and associated measurementsmore »
- Authors:
-
- Univ. of Pittsburgh, Pittsburgh, PA (United States); Swiss Federal Lab. for Materials Science and Technology, Duebendorf (Switzerland)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Univ. of Pittsburgh, Pittsburgh, PA (United States)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Ecole Polytechnique Federale de Lausanne (Lausanne)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)l; Integrated Dynamic Electron Solutions, Pleasanton, CA (United States)
- Materials Science Division, Physical and Life Science Directorate, Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94551, USA
- Publication Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1313560
- Alternate Identifier(s):
- OSTI ID: 1282415
- Report Number(s):
- LLNL-JRNL-676422
Journal ID: ISSN 0021-8979; JAPIAU
- Grant/Contract Number:
- AC52-07NA27344; FWP SCW0974
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 120; Journal Issue: 5; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; solidification; transmission electron microscopy; liquid thin films; liquid solid interfaces; crystal growth
Citation Formats
Zweiacker, K., McKeown, J. T., Liu, C., LaGrange, T., Reed, B. W., Campbell, G. H., and Wiezorek, J. M. K. Determination of crystal growth rates during rapid solidification of polycrystalline aluminum by nano-scale spatio-temporal resolution in situ transmission electron microscopy. United States: N. p., 2016.
Web. doi:10.1063/1.4960443.
Zweiacker, K., McKeown, J. T., Liu, C., LaGrange, T., Reed, B. W., Campbell, G. H., & Wiezorek, J. M. K. Determination of crystal growth rates during rapid solidification of polycrystalline aluminum by nano-scale spatio-temporal resolution in situ transmission electron microscopy. United States. https://doi.org/10.1063/1.4960443
Zweiacker, K., McKeown, J. T., Liu, C., LaGrange, T., Reed, B. W., Campbell, G. H., and Wiezorek, J. M. K. Thu .
"Determination of crystal growth rates during rapid solidification of polycrystalline aluminum by nano-scale spatio-temporal resolution in situ transmission electron microscopy". United States. https://doi.org/10.1063/1.4960443. https://www.osti.gov/servlets/purl/1313560.
@article{osti_1313560,
title = {Determination of crystal growth rates during rapid solidification of polycrystalline aluminum by nano-scale spatio-temporal resolution in situ transmission electron microscopy},
author = {Zweiacker, K. and McKeown, J. T. and Liu, C. and LaGrange, T. and Reed, B. W. and Campbell, G. H. and Wiezorek, J. M. K.},
abstractNote = {In situ investigations of rapid solidification in polycrystalline Al thin films were conducted using nano-scale spatio-temporal resolution dynamic transmission electron microscopy. Differences in crystal growth rates and asymmetries in melt pool development were observed as the heat extraction geometry was varied by controlling the proximity of the laser-pulse irradiation and the associated induced melt pools to the edge of the transmission electron microscopy support grid, which acts as a large heat sink. Experimental parameters have been established to maximize the reproducibility of the material response to the laser-pulse-related heating and to ensure that observations of the dynamical behavior of the metal are free from artifacts, leading to accurate interpretations and quantifiable measurements with improved precision. Interface migration rate measurements revealed solidification velocities that increased consistently from ~1.3 m s–1 to ~2.5 m s–1 during the rapid solidification process of the Al thin films. Under the influence of an additional large heat sink, increased crystal growth rates as high as 3.3 m s–1 have been measured. The in situ experiments also provided evidence for development of a partially melted, two-phase region prior to the onset of rapid solidification facilitated crystal growth. As a result, using the experimental observations and associated measurements as benchmarks, finite-element modeling based calculations of the melt pool evolution after pulsed laser irradiation have been performed to obtain estimates of the temperature evolution in the thin films.},
doi = {10.1063/1.4960443},
journal = {Journal of Applied Physics},
number = 5,
volume = 120,
place = {United States},
year = {Thu Aug 04 00:00:00 EDT 2016},
month = {Thu Aug 04 00:00:00 EDT 2016}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 11 works
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
In situ Transmission Electron Microscopy of Rapidly Solidifying Metals and Alloys
journal, July 2011
- Kulovits, A.; Wiezorek, J.; LaGrange, T.
- Microscopy and Microanalysis, Vol. 17, Issue S2
Examination of the electronic structure of crystalline and liquid Al versus temperature by in situ electron energy-loss spectroscopy (EELS)
journal, September 2015
- Palanisamy, Prakash; Jong, Maarten de; Asta, Mark
- Micron, Vol. 76
In situ transmission electron microscopy of crystal growth-mode transitions during rapid solidification of a hypoeutectic Al–Cu alloy
journal, February 2014
- McKeown, Joseph T.; Kulovits, Andreas K.; Liu, Can
- Acta Materialia, Vol. 65
Structure Evolution During Processing of Polycrystalline Films
journal, August 2000
- Thompson, C. V.
- Annual Review of Materials Science, Vol. 30, Issue 1
Imaging of Transient Structures Using Nanosecond in Situ TEM
journal, September 2008
- Kim, Judy S.; LaGrange, Thomas; Reed, Bryan W.
- Science, Vol. 321, Issue 5895
Ultrafast Imaging of Rapid Alloy Solidification in Al-Cu Thin Films
journal, July 2012
- McKeown, J. T.; LaGrange, T.; Reed, B. W.
- Microscopy and Microanalysis, Vol. 18, Issue S2
Four-zone solidification microstructure formed by laser melting of copper thin films
journal, October 2009
- Zhong, R.; Kulovits, A.; Wiezorek, J. M. K.
- Applied Surface Science, Vol. 256, Issue 1
Thermal Conductivity of Silicon from 300 to 1400°K
journal, June 1963
- Shanks, H. R.; Maycock, P. D.; Sidles, P. H.
- Physical Review, Vol. 130, Issue 5
Premelting of the Al(110) surface from a local perspective
journal, October 2000
- Zivieri, R.; Santoro, G.; Bortolani, V.
- Physical Review B, Vol. 62, Issue 15
Thermally driven grain boundary migration and melting in Cu
journal, February 2015
- Li, Y. H.; Wang, L.; Li, B.
- The Journal of Chemical Physics, Vol. 142, Issue 5
Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope
journal, November 2012
- LaGrange, Thomas; Reed, Bryan W.; Santala, Melissa K.
- Micron, Vol. 43, Issue 11, p. 1108-1120
Time-resolved structural dynamics of thin metal films heated with femtosecond optical pulses
journal, November 2011
- Chen, J.; Chen, W. -K.; Tang, J.
- Proceedings of the National Academy of Sciences, Vol. 108, Issue 47
Observations of interface premelting at grain-boundary precipitates of Pb in Al
journal, September 2004
- Dahmen ¶, U.; Hagège, S.; Faudot, F.
- Philosophical Magazine, Vol. 84, Issue 25-26
Grain Boundary-Mediated Plasticity in Nanocrystalline Nickel
journal, July 2004
- Shan, Z.
- Science, Vol. 305, Issue 5684
Movie-mode dynamic electron microscopy
journal, January 2015
- LaGrange, Thomas; Reed, Bryan W.; Masiel, Daniel J.
- MRS Bulletin, Vol. 40, Issue 1
Thermal Conductivity of Silicon and Germanium from 3°K to the Melting Point
journal, May 1964
- Glassbrenner, C. J.; Slack, Glen A.
- Physical Review, Vol. 134, Issue 4A
Analysis of Multidimensional Conduction Phase Change Via the Enthalpy Model
journal, August 1975
- Shamsundar, N.; Sparrow, E. M.
- Journal of Heat Transfer, Vol. 97, Issue 3
Thermal conductivity of selected materials
report, January 1966
- Powell, R. W.; Ho, C. Y.; Liley, P. E.
Processing of discontinuously-reinforced metal matrix composites by rapid solidification
journal, January 1995
- Srivatsan, T. S.; Sudarshan, T. S.; Lavernia, E. J.
- Progress in Materials Science, Vol. 39, Issue 4-5
Determination of the absolute fluence profile in pulsed laser processing using melt-induced phase changes in an amorphous silicon thin film
journal, May 2006
- Leonard, J. P.
- Review of Scientific Instruments, Vol. 77, Issue 5
Nanosecond time-resolved investigations using the in situ of dynamic transmission electron microscope (DTEM)
journal, October 2008
- LaGrange, Thomas; Campbell, Geoffrey H.; Reed, B. W.
- Ultramicroscopy, Vol. 108, Issue 11, p. 1441-1449
Grain size determination in nano-scale polycrystalline aggregates by precession illumination-hollow cone dark field imaging in the transmission electron microscope
journal, January 2012
- Kulovits, A. K.; Facco, G.; Wiezorek, J. M. K.
- Materials Characterization, Vol. 63, p. 17-26
In Situ High-Resolution Transmission Electron Microscopy in the Study of Nanomaterials and Properties
journal, February 2008
- Howe, James M.; Mori, Hirotaro; Wang, Zhong Lin
- MRS Bulletin, Vol. 33, Issue 2
Thermodynamics of grain boundary premelting in alloys. I. Phase-field modeling
journal, August 2009
- Mishin, Y.; Boettinger, W. J.; Warren, J. A.
- Acta Materialia, Vol. 57, Issue 13
Time resolved electron microscopy for in situ experiments
journal, December 2014
- Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K.
- Applied Physics Reviews, Vol. 1, Issue 4
Ultrafast electron microscopy in materials science, biology, and chemistry
journal, June 2005
- King, Wayne E.; Campbell, Geoffrey H.; Frank, Alan
- Journal of Applied Physics, Vol. 97, Issue 11
Crystal Growth Mode Changes during Pulsed Laser Induced Rapid Solidification in Nanoscale Thin Films of Al-Cu Eutectic
journal, August 2014
- Zweiacker, Kai; Liu, Can; McKeown, Joseph T.
- Microscopy and Microanalysis, Vol. 20, Issue S3
Thermal conductivity and diffusivity of free‐standing silicon nitride thin films
journal, February 1995
- Zhang, Xiang; Grigoropoulos, Costas P.
- Review of Scientific Instruments, Vol. 66, Issue 2
Automated crystal orientation and phase mapping in TEM
journal, December 2014
- Rauch, E. F.; Véron, M.
- Materials Characterization, Vol. 98
Electron microscopy of geometrically confined copper thin films after rapid lateral solidification
journal, May 2009
- Kulovits, A.; Zhong, R.; Wiezorek, J. M. K.
- Thin Solid Films, Vol. 517, Issue 13
Capturing Dynamics of Pulsed Laser Induced Melting and Rapid Solidification in Aluminum Polycrystals with Nanoscale Temporal Resolution In-situ TEM
journal, August 2014
- Wiezorek, Jörg M. K.; McKeown, Joseph T.; Zweiacker, Kai
- Microscopy and Microanalysis, Vol. 20, Issue S3
Mathematical modelling of solidification and melting: a review
journal, July 1996
- Hu, Henry; Argyropoulos, Stavros A.
- Modelling and Simulation in Materials Science and Engineering, Vol. 4, Issue 4
Time-Resolved In Situ Measurements During Rapid Alloy Solidification: Experimental Insight for Additive Manufacturing
journal, January 2016
- McKeown, Joseph T.; Zweiacker, Kai; Liu, Can
- JOM, Vol. 68, Issue 3
Revealing the transient states of rapid solidification in aluminum thin films using ultrafast in situ transmission electron microscopy
journal, April 2011
- Kulovits, Andreas; Wiezorek, Jörg M. K.; LaGrange, Thomas
- Philosophical Magazine Letters, Vol. 91, Issue 4
Strengthening of austenitic stainless steel by formation of nanocrystalline γ-phase through severe plastic deformation during two-dimensional linear plane-strain machining
journal, May 2013
- Idell, Y.; Facco, G.; Kulovits, A.
- Scripta Materialia, Vol. 68, Issue 9
An Atomic-Level View of Melting Using Femtosecond Electron Diffraction
journal, November 2003
- Siwick, Bradley J.; Dwyer, Jason R.; Jordan, Robert E.
- Science, Vol. 302, Issue 5649
Works referencing / citing this record:
High-Speed Electron Microscopy
book, January 2019
- Campbell, Geoffrey H.; McKeown, Joseph T.; Santala, Melissa K.
- Springer Handbook of Microscopy