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Title: Using benchmarks for radiation testing of microprocessors and FPGAs

Performance benchmarks have been used over the years to compare different systems. These benchmarks can be useful for researchers trying to determine how changes to the technology, architecture, or compiler affect the system's performance. No such standard exists for systems deployed into high radiation environments, making it difficult to assess whether changes in the fabrication process, circuitry, architecture, or software affect reliability or radiation sensitivity. In this paper, we propose a benchmark suite for high-reliability systems that is designed for field-programmable gate arrays and microprocessors. As a result, we describe the development process and report neutron test data for the hardware and software benchmarks.
 [1] ;  [2] ;  [3] ;  [4] ;  [5] ;  [6] ;  [7] ;  [7] ;  [8] ;  [9] ;  [3] ;  [2] ;  [7] ;  [6] ;  [6] ;  [10]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  2. Vanderbilt Univ., Nashville, TN (United States)
  3. Univ. Federal do Rio Grande do Sul, Porto Alegre (Brasil)
  4. Univ. de Sevilla, Sevilla (Spain)
  5. Stellenbosch Univ., Stellenbosch (South Africa)
  6. Politecnico di Torino, Torino (Italy)
  7. Univ. Carlos III de Madrid, Madrid (Spain)
  8. California Institute of Technology, Pasadena, CA (United States)
  9. Northeastern Univ., Boston, MA (United States)
  10. Brigham Young Univ., Provo, UT (United States)
Publication Date:
Report Number(s):
LA-UR-15-24958; LA-UR-15-28660
Journal ID: ISSN 0018-9499
Grant/Contract Number:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 62; Journal Issue: 6; Conference: IEEE NSREC, Boston, MA (United States), 13 Jul 2015; Journal ID: ISSN 0018-9499
Institute of Electrical and Electronics Engineers (IEEE)
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
Country of Publication:
United States
97 MATHEMATICS AND COMPUTING; software fault tolerance; Field-programmable gate arrays (FPGAs); soft error rates; soft errors
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1356128