Using benchmarks for radiation testing of microprocessors and FPGAs

Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia-Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez-Clemente, Antonio; Reorda, Matteo Sonza; Sterpone, Luca; Wirthlin, Michael

doi:10.1109/TNS.2015.2498313

Title: Using benchmarks for radiation testing of microprocessors and FPGAs

Full Record
Other Related Research

Authors:

Quinn, Heather ^[1]; Robinson, William H. ^[2]; Rech, Paolo ^[3]; Aguirre, Miguel ^[4]; Barnard, Arno ^[5]; Desogus, Marco ^[6]; Entrena, Luis ^[7]; Garcia-Valderas, Mario ^[7]; Guertin, Steven M. ^[8]; Kaeli, David ^[9]; Kastensmidt, Fernanda Lima ^[3]; Kiddie, Bradley T. ^[2]; Sanchez-Clemente, Antonio ^[7]; Reorda, Matteo Sonza ^[6]; Sterpone, Luca ^[6]; Wirthlin, Michael ^[10]

Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Vanderbilt Univ., Nashville, TN (United States)
Univ. Federal do Rio Grande do Sul, Porto Alegre (Brasil)
Univ. de Sevilla, Sevilla (Spain)
Stellenbosch Univ., Stellenbosch (South Africa)
Politecnico di Torino, Torino (Italy)
Univ. Carlos III de Madrid, Madrid (Spain)
California Institute of Technology, Pasadena, CA (United States)
Northeastern Univ., Boston, MA (United States)
Brigham Young Univ., Provo, UT (United States)

Publication Date:: Thu Dec 17 00:00:00 EST 2015

Research Org.:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1312569

Alternate Identifier(s):: OSTI ID: 1356128

Report Number(s):: LA-UR-15-24958; LA-UR-15-28660
Journal ID: ISSN 0018-9499

Grant/Contract Number:: AC52-06NA25396

Resource Type:: Accepted Manuscript

Journal Name:: IEEE Transactions on Nuclear Science

Additional Journal Information:: Journal Volume: 62; Journal Issue: 6; Conference: IEEE NSREC, Boston, MA (United States), 13 Jul 2015; Journal ID: ISSN 0018-9499

Publisher:: Institute of Electrical and Electronics Engineers (IEEE)

Country of Publication:: United States

Language:: English

Subject:: 97 MATHEMATICS AND COMPUTING; software fault tolerance; Field-programmable gate arrays (FPGAs); soft error rates; soft errors

Citation Formats


                    Quinn, Heather, Robinson, William H., Rech, Paolo, Aguirre, Miguel, Barnard, Arno, Desogus, Marco, Entrena, Luis, Garcia-Valderas, Mario, Guertin, Steven M., Kaeli, David, Kastensmidt, Fernanda Lima, Kiddie, Bradley T., Sanchez-Clemente, Antonio, Reorda, Matteo Sonza, Sterpone, Luca, and Wirthlin, Michael. Using benchmarks for radiation testing of microprocessors and FPGAs.  United States: N. p., 2015. 
Web.  doi:10.1109/TNS.2015.2498313.

Copy to clipboard


                    Quinn, Heather, Robinson, William H., Rech, Paolo, Aguirre, Miguel, Barnard, Arno, Desogus, Marco, Entrena, Luis, Garcia-Valderas, Mario, Guertin, Steven M., Kaeli, David, Kastensmidt, Fernanda Lima, Kiddie, Bradley T., Sanchez-Clemente, Antonio, Reorda, Matteo Sonza, Sterpone, Luca, & Wirthlin, Michael. Using benchmarks for radiation testing of microprocessors and FPGAs.  United States.  https://doi.org/10.1109/TNS.2015.2498313

Copy to clipboard


                    Quinn, Heather, Robinson, William H., Rech, Paolo, Aguirre, Miguel, Barnard, Arno, Desogus, Marco, Entrena, Luis, Garcia-Valderas, Mario, Guertin, Steven M., Kaeli, David, Kastensmidt, Fernanda Lima, Kiddie, Bradley T., Sanchez-Clemente, Antonio, Reorda, Matteo Sonza, Sterpone, Luca, and Wirthlin, Michael. Thu .  
"Using benchmarks for radiation testing of microprocessors and FPGAs".  United States.  https://doi.org/10.1109/TNS.2015.2498313.  https://www.osti.gov/servlets/purl/1312569.

Copy to clipboard


                    
@article{osti_1312569,

  title        = {Using benchmarks for radiation testing of microprocessors and FPGAs},

  author       = {Quinn, Heather and Robinson, William H. and Rech, Paolo and Aguirre, Miguel and Barnard, Arno and Desogus, Marco and Entrena, Luis and Garcia-Valderas, Mario and Guertin, Steven M. and Kaeli, David and Kastensmidt, Fernanda Lima and Kiddie, Bradley T. and Sanchez-Clemente, Antonio and Reorda, Matteo Sonza and Sterpone, Luca and Wirthlin, Michael},

  abstractNote = {},

  doi          = {10.1109/TNS.2015.2498313},

  journal      = {IEEE Transactions on Nuclear Science},

  number       = 6,

  volume       = 62,

  place        = {United States},

  year         = {Thu Dec 17 00:00:00 EST 2015},

  month        = {Thu Dec 17 00:00:00 EST 2015}

}

Copy to clipboard

Journal Article:

Free Publicly Available Full Text

Accepted Manuscript (DOE)

Publisher's Version of Record

https://doi.org/10.1109/TNS.2015.2498313

Other availability

Search WorldCat to find libraries that may hold this journal

Citation Metrics:

Cited by: 65 works

Citation information provided by
Web of Science

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE PAGES and OSTI.GOV collections:

Update to the Microcontroller Benchmark for Radiation Testing

Software Quinn, Heather ; USDOE National Nuclear Security Administration

LANL developed a benchmark of software code for radiation testing of microprocessors several years ago, and it was published under an open-source license on GitHub. Publishing the software is necessary for other researchers to adopt and implement this benchmark for radiation testing of other microprocessors to standardize test practices so that test data can be compared across different microprocessors. The original codes have been used several times by other organizations to test a wide range of microcontrollers and microprocessors. After several years of research, LANL is ready to update the benchmark. Changes include: 1. Addition of new codes that allowmore »« less
https://doi.org/10.11578/dc.20231103.1

View Software
Evaluation of CHO Benchmarks on the Arria 10 FPGA using Intel FPGA SDK for OpenCL

Technical Report Jin, Zheming ; Yoshii, Kazutomo ; Finkel, Hal ; ...

The OpenCL standard is an open programming model for accelerating algorithms on heterogeneous computing system. OpenCL extends the C-based programming language for developing portable codes on different platforms such as CPU, Graphics processing units (GPUs), Digital Signal Processors (DSPs) and Field Programmable Gate Arrays (FPGAs). The Intel FPGA SDK for OpenCL is a suite of tools that allows developers to abstract away the complex FPGA-based development flow for a high-level software development flow. Users can focus on the design of hardware-accelerated kernel functions in OpenCL and then direct the tools to generate the low-level FPGA implementations. The approach makes themore »« less
https://doi.org/10.2172/1372106

Full Text Available
A test methodology for determining space-readiness of Xilinx SRAM-based FPGA devices and designs

Journal Article Quinn, Heather M ; Graham, Paul S ; Morgan, Keith ; ... - IEEE Transactions on Instrumentation and Measurement

No abstract prepared.
Full Text Available
A Test Methodology for Determining Space-Readiness of Xilinx SRAM-Based FPGA Designs

Conference Quinn, Heather M ; Graham, Paul S ; Morgan, Keith S ; ...

Using reconfigurable, static random-access memory (SRAM) based field-programmable gate arrays (FPGAs) for space-based computation has been an exciting area of research for the past decade. Since both the circuit and the circuit's state is stored in radiation-tolerant memory, both could be alterd by the harsh space radiation environment. Both the circuit and the circuit's state can be prote cted by triple-moduler redundancy (TMR), but applying TMR to FPGA user designs is often an error-prone process. Faulty application of TMR could cause the FPGA user circuit to output incorrect data. This paper will describe a three-tiered methodology for testing FPGA usermore »« less
https://doi.org/10.1109/AUTEST.2008.4662621

Full Text Available
V and V techniques for FPGA-based I and C systems - How do they compare with techniques for microprocessors? - 355

Conference George, Sam ; Guerra, Sofia

We compare verification and validation (V and V) techniques for FPGA and microprocessor-based instrumentation and control (I and C) systems from the point of view of standards compliance, an approach based on behavioural properties, and the analysis of vulnerabilities. We found that the non-technology-specific elements of the standards considered are very similar. Differences are more marked when considering behavioural properties and vulnerabilities: the amount of effort required and confidence level obtained depend on a number of properties of the particular design under verification. (authors)

Similar Records