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Title: Experimental verification of epsilon-near-zero plasmon polariton modes in degenerately doped semiconductor nanolayers

Abstract

Here, we investigate optical polariton modes supported by subwavelength-thick degenerately doped semiconductor nanolayers (e.g. indium tin oxide) on glass in the epsilon-near-zero (ENZ) regime. The dispersions of the radiative (R, on the left of the light line) and non-radiative (NR, on the right of the light line) ENZ polariton modes are experimentally measured and theoretically analyzed through the transfer matrix method and the complex-frequency/real-wavenumber analysis, which are in remarkable agreement. We observe directional near-perfect absorption using the Kretschmann geometry for incidence conditions close to the NR-ENZ polariton mode dispersion. Along with field enhancement, this provides us with an unexplored pathway to enhance nonlinear optical processes and to open up directions for ultrafast, tunable thermal emission.

Authors:
 [1];  [2];  [3];  [1];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Texas A&M Univ.-Corpus Christi, Corpus Christi, TX (United States)
  3. AMRDEC, Charles M. Bowden Research Lab., Redstone Arsenal, AL (United States). National Research Council
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1297916
Report Number(s):
SAND-2016-7499J
Journal ID: ISSN 1094-4087; OPEXFF; 646521
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 24; Journal Issue: 16; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; thin films; subwavelength structures; nanostructures; optical properties; surface plasmons

Citation Formats

Campione, Salvatore, Kim, Iltai, de Ceglia, Domenico, Keeler, Gordon A., and Luk, Ting S. Experimental verification of epsilon-near-zero plasmon polariton modes in degenerately doped semiconductor nanolayers. United States: N. p., 2016. Web. https://doi.org/10.1364/OE.24.018782.
Campione, Salvatore, Kim, Iltai, de Ceglia, Domenico, Keeler, Gordon A., & Luk, Ting S. Experimental verification of epsilon-near-zero plasmon polariton modes in degenerately doped semiconductor nanolayers. United States. https://doi.org/10.1364/OE.24.018782
Campione, Salvatore, Kim, Iltai, de Ceglia, Domenico, Keeler, Gordon A., and Luk, Ting S. Fri . "Experimental verification of epsilon-near-zero plasmon polariton modes in degenerately doped semiconductor nanolayers". United States. https://doi.org/10.1364/OE.24.018782. https://www.osti.gov/servlets/purl/1297916.
@article{osti_1297916,
title = {Experimental verification of epsilon-near-zero plasmon polariton modes in degenerately doped semiconductor nanolayers},
author = {Campione, Salvatore and Kim, Iltai and de Ceglia, Domenico and Keeler, Gordon A. and Luk, Ting S.},
abstractNote = {Here, we investigate optical polariton modes supported by subwavelength-thick degenerately doped semiconductor nanolayers (e.g. indium tin oxide) on glass in the epsilon-near-zero (ENZ) regime. The dispersions of the radiative (R, on the left of the light line) and non-radiative (NR, on the right of the light line) ENZ polariton modes are experimentally measured and theoretically analyzed through the transfer matrix method and the complex-frequency/real-wavenumber analysis, which are in remarkable agreement. We observe directional near-perfect absorption using the Kretschmann geometry for incidence conditions close to the NR-ENZ polariton mode dispersion. Along with field enhancement, this provides us with an unexplored pathway to enhance nonlinear optical processes and to open up directions for ultrafast, tunable thermal emission.},
doi = {10.1364/OE.24.018782},
journal = {Optics Express},
number = 16,
volume = 24,
place = {United States},
year = {2016},
month = {1}
}

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Cited by: 12 works
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    Works referencing / citing this record:

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