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Title: Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis

Abstract

In this paper, atomic level spatial variability of electronic structure in Fe-based superconductor FeTe0.55Se0.45 (Tc = 15 K) is explored using current-imaging tunneling-spectroscopy. Multivariate statistical analysis of the data differentiates regions of dissimilar electronic behavior that can be identified with the segregation of chalcogen atoms, as well as boundaries between terminations and near neighbor interactions. Subsequent clustering analysis allows identification of the spatial localization of these dissimilar regions. Similar statistical analysis of modeled calculated density of states of chemically inhomogeneous FeTe1-x Sex structures further confirms that the two types of chalcogens, i.e., Te and Se, can be identified by their electronic signature and differentiated by their local chemical environment. Finally, this approach allows detailed chemical discrimination of the scanning tunneling microscopy data including separation of atomic identities, proximity, and local configuration effects and can be universally applicable to chemically and electronically inhomogeneous surfaces.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1265676
Alternate Identifier(s):
OSTI ID: 1286693
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
APL Materials
Additional Journal Information:
Journal Volume: 2; Journal Issue: 12; Journal ID: ISSN 2166-532X
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; multivariate statistics; superconductors; STM

Citation Formats

Belianinov, Alex, Panchapakesan, G., Lin, Wenzhi, Sales, Brian C., Sefat, Athena Safa, Jesse, Stephen, Pan, Minghu, and Kalinin, Sergei V. Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis. United States: N. p., 2014. Web. doi:10.1063/1.4902996.
Belianinov, Alex, Panchapakesan, G., Lin, Wenzhi, Sales, Brian C., Sefat, Athena Safa, Jesse, Stephen, Pan, Minghu, & Kalinin, Sergei V. Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis. United States. https://doi.org/10.1063/1.4902996
Belianinov, Alex, Panchapakesan, G., Lin, Wenzhi, Sales, Brian C., Sefat, Athena Safa, Jesse, Stephen, Pan, Minghu, and Kalinin, Sergei V. Tue . "Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis". United States. https://doi.org/10.1063/1.4902996. https://www.osti.gov/servlets/purl/1265676.
@article{osti_1265676,
title = {Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis},
author = {Belianinov, Alex and Panchapakesan, G. and Lin, Wenzhi and Sales, Brian C. and Sefat, Athena Safa and Jesse, Stephen and Pan, Minghu and Kalinin, Sergei V.},
abstractNote = {In this paper, atomic level spatial variability of electronic structure in Fe-based superconductor FeTe0.55Se0.45 (Tc = 15 K) is explored using current-imaging tunneling-spectroscopy. Multivariate statistical analysis of the data differentiates regions of dissimilar electronic behavior that can be identified with the segregation of chalcogen atoms, as well as boundaries between terminations and near neighbor interactions. Subsequent clustering analysis allows identification of the spatial localization of these dissimilar regions. Similar statistical analysis of modeled calculated density of states of chemically inhomogeneous FeTe1-x Sex structures further confirms that the two types of chalcogens, i.e., Te and Se, can be identified by their electronic signature and differentiated by their local chemical environment. Finally, this approach allows detailed chemical discrimination of the scanning tunneling microscopy data including separation of atomic identities, proximity, and local configuration effects and can be universally applicable to chemically and electronically inhomogeneous surfaces.},
doi = {10.1063/1.4902996},
journal = {APL Materials},
number = 12,
volume = 2,
place = {United States},
year = {Tue Dec 02 00:00:00 EST 2014},
month = {Tue Dec 02 00:00:00 EST 2014}
}

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