Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
Abstract
Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers
- Authors:
-
- Queen's Univ., Belfast, Northern Ireland (United Kingdom)
- Univ. of Rome Tor Vergata (Italy)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1265759
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- APL Materials
- Additional Journal Information:
- Journal Volume: 3; Journal ID: ISSN 2166-532X
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Farrow, Tim, Yang, Nan, Doria, Sandra, Belianinov, Alex, Jesse, Stephen, Arruda, Thomas M., Balestrino, Giuseppe, Kalinin, Sergei V., and Kumar, Amit. Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films. United States: N. p., 2015.
Web. doi:10.1063/1.4914943.
Farrow, Tim, Yang, Nan, Doria, Sandra, Belianinov, Alex, Jesse, Stephen, Arruda, Thomas M., Balestrino, Giuseppe, Kalinin, Sergei V., & Kumar, Amit. Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films. United States. https://doi.org/10.1063/1.4914943
Farrow, Tim, Yang, Nan, Doria, Sandra, Belianinov, Alex, Jesse, Stephen, Arruda, Thomas M., Balestrino, Giuseppe, Kalinin, Sergei V., and Kumar, Amit. Tue .
"Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films". United States. https://doi.org/10.1063/1.4914943. https://www.osti.gov/servlets/purl/1265759.
@article{osti_1265759,
title = {Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films},
author = {Farrow, Tim and Yang, Nan and Doria, Sandra and Belianinov, Alex and Jesse, Stephen and Arruda, Thomas M. and Balestrino, Giuseppe and Kalinin, Sergei V. and Kumar, Amit},
abstractNote = {Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers},
doi = {10.1063/1.4914943},
journal = {APL Materials},
number = ,
volume = 3,
place = {United States},
year = {Tue Mar 17 00:00:00 EDT 2015},
month = {Tue Mar 17 00:00:00 EDT 2015}
}
Web of Science
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Works referencing / citing this record:
Room Temperature Polarization Phenomena in Nanocrystalline and Epitaxial Thin Films of Gd-Doped Ceria Studied by Kelvin Probe Force Microscopy
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