Band Excitation Kelvin probe force microscopy utilizing photothermal excitation
Abstract
A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. In conclusion, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.
- Authors:
-
- University College Dublin, Belfield, Dublin (Ireland)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1265398
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 106; Journal Issue: 10; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE
Citation Formats
Collins, Liam, Jesse, Stephen, Balke, Nina, Rodriguez, Brian J., Kalinin, Sergei, and Li, Qian. Band Excitation Kelvin probe force microscopy utilizing photothermal excitation. United States: N. p., 2015.
Web. doi:10.1063/1.4913910.
Collins, Liam, Jesse, Stephen, Balke, Nina, Rodriguez, Brian J., Kalinin, Sergei, & Li, Qian. Band Excitation Kelvin probe force microscopy utilizing photothermal excitation. United States. https://doi.org/10.1063/1.4913910
Collins, Liam, Jesse, Stephen, Balke, Nina, Rodriguez, Brian J., Kalinin, Sergei, and Li, Qian. Fri .
"Band Excitation Kelvin probe force microscopy utilizing photothermal excitation". United States. https://doi.org/10.1063/1.4913910. https://www.osti.gov/servlets/purl/1265398.
@article{osti_1265398,
title = {Band Excitation Kelvin probe force microscopy utilizing photothermal excitation},
author = {Collins, Liam and Jesse, Stephen and Balke, Nina and Rodriguez, Brian J. and Kalinin, Sergei and Li, Qian},
abstractNote = {A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. In conclusion, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.},
doi = {10.1063/1.4913910},
journal = {Applied Physics Letters},
number = 10,
volume = 106,
place = {United States},
year = {Fri Mar 13 00:00:00 EDT 2015},
month = {Fri Mar 13 00:00:00 EDT 2015}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 15 works
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Kelvin probe force microscopy for characterization of semiconductor devices and processes
journal, March 1996
- Tanimoto, Masafumi
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 14, Issue 2
Kelvin Probe Force Microscopy Study on Conjugated Polymer/Fullerene Bulk Heterojunction Organic Solar Cells
journal, February 2005
- Hoppe, H.; Glatzel, T.; Niggemann, M.
- Nano Letters, Vol. 5, Issue 2
Variations in the work function of doped single- and few-layer graphene assessed by Kelvin probe force microscopy and density functional theory
journal, June 2011
- Ziegler, D.; Gava, P.; Güttinger, J.
- Physical Review B, Vol. 83, Issue 23
Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices
journal, July 2013
- Strelcov, Evgheni; Jesse, Stephen; Huang, Yen-Lin
- ACS Nano, Vol. 7, Issue 8
Electrostatic force microscopy: principles and some applications to semiconductors
journal, November 2001
- Girard, Paul
- Nanotechnology, Vol. 12, Issue 4
Open-loop band excitation Kelvin probe force microscopy
journal, March 2012
- Guo, Senli; Kalinin, Sergei V.; Jesse, Stephen
- Nanotechnology, Vol. 23, Issue 12
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
journal, September 2007
- Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger
- Nanotechnology, Vol. 18, Issue 43
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy
journal, March 2011
- Mélin, T.; Barbet, S.; Diesinger, H.
- Review of Scientific Instruments, Vol. 82, Issue 3
Imaging Surface Charges of Individual Biomolecules
journal, July 2009
- Leung, Carl; Kinns, Helen; Hoogenboom, Bart W.
- Nano Letters, Vol. 9, Issue 7
Open loop Kelvin probe force microscopy with single and multi-frequency excitation
journal, October 2013
- Collins, L.; Kilpatrick, J. I.; Weber, S. A. L.
- Nanotechnology, Vol. 24, Issue 47
Tip−Sample Interactions in Kelvin Probe Force Microscopy: Quantitative Measurement of the Local Surface Potential
journal, October 2008
- Liscio, Andrea; Palermo, Vincenzo; Müllen, Klaus
- The Journal of Physical Chemistry C, Vol. 112, Issue 44
Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface
journal, March 2014
- Collins, Liam; Kilpatrick, Jason I.; Vlassiouk, Ivan V.
- Applied Physics Letters, Vol. 104, Issue 13
Half-harmonic Kelvin probe force microscopy with transfer function correction
journal, February 2012
- Guo, Senli; Kalinin, Sergei V.; Jesse, Stephen
- Applied Physics Letters, Vol. 100, Issue 6
High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy
journal, May 2012
- Sugawara, Yasuhiro; Kou, Lili; Ma, Zongmin
- Applied Physics Letters, Vol. 100, Issue 22
Tip-induced band bending and its effect on local barrier height measurement studied by light-modulated scanning tunneling spectroscopy
journal, January 2006
- Yoshida, Shoji; Kikuchi, Junichi; Kanitani, Yuya
- e-Journal of Surface Science and Nanotechnology, Vol. 4
Kelvin probe force microscopy
journal, June 1991
- Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K.
- Applied Physics Letters, Vol. 58, Issue 25
Quantitative Nanoscale Dielectric Microscopy of Single-Layer Supported Biomembranes
journal, April 2009
- Fumagalli, Laura; Ferrari, Giorgio; Sampietro, Marco
- Nano Letters, Vol. 9, Issue 4
Surface potential at surface-interface junctions in bicrystals
journal, October 2000
- Kalinin, Sergei V.; Bonnell, Dawn A.
- Physical Review B, Vol. 62, Issue 15
ac driving amplitude dependent systematic error in scanning Kelvin probe microscope measurements: Detection and correction
journal, April 2006
- Wu, Yan; Shannon, Mark A.
- Review of Scientific Instruments, Vol. 77, Issue 4
Local potential and polarization screening on ferroelectric surfaces
journal, March 2001
- Kalinin, Sergei V.; Bonnell, Dawn A.
- Physical Review B, Vol. 63, Issue 12
High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscope
journal, June 1998
- Kitamura, Shin’ichi; Iwatsuki, Masashi
- Applied Physics Letters, Vol. 72, Issue 24
Label-free identification of single dielectric nanoparticles and viruses with ultraweak polarization forces
journal, July 2012
- Fumagalli, Laura; Esteban-Ferrer, Daniel; Cuervo, Ana
- Nature Materials, Vol. 11, Issue 9
Local electrical dissipation imaged by scanning force microscopy
journal, October 1991
- Denk, Winfried; Pohl, Dieter W.
- Applied Physics Letters, Vol. 59, Issue 17
Probing Local Bias-Induced Transitions Using Photothermal Excitation Contact Resonance Atomic Force Microscopy and Voltage Spectroscopy
journal, January 2015
- Li, Qian; Jesse, Stephen; Tselev, Alexander
- ACS Nano, Vol. 9, Issue 2
Resolution and contrast in Kelvin probe force microscopy
journal, August 1998
- Jacobs, H. O.; Leuchtmann, P.; Homan, O. J.
- Journal of Applied Physics, Vol. 84, Issue 3
Scanning Kelvin Probe Force Microscopy
journal, January 2004
- Blücher, D. Bengtsson; Svensson, J. -E.; Johansson, L. -G.
- Journal of The Electrochemical Society, Vol. 151, Issue 12
Label-free and high-resolution protein/DNA nanoarray analysis using Kelvin probe force microscopy
journal, September 2007
- Sinensky, Asher K.; Belcher, Angela M.
- Nature Nanotechnology, Vol. 2, Issue 10
Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale
journal, July 2013
- Strelcov, Evgheni; Kim, Yunseok; Jesse, Stephen
- Nano Letters, Vol. 13, Issue 8
Quantifying the dielectric constant of thick insulators using electrostatic force microscopy
journal, May 2010
- Fumagalli, L.; Gramse, G.; Esteban-Ferrer, D.
- Applied Physics Letters, Vol. 96, Issue 18
Quantitative dielectric constant measurement of thin films by DC electrostatic force microscopy
journal, September 2009
- Gramse, G.; Casuso, I.; Toset, J.
- Nanotechnology, Vol. 20, Issue 39
Sub-surface imaging of carbon nanotube–polymer composites using dynamic AFM methods
journal, March 2013
- Cadena, Maria J.; Misiego, Rocio; Smith, Kyle C.
- Nanotechnology, Vol. 24, Issue 13
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope
journal, March 2002
- Okamoto, Kenji; Sugawara, Yasuhiro; Morita, Seizo
- Applied Surface Science, Vol. 188, Issue 3-4
Accuracy and resolution limits of Kelvin probe force microscopy
journal, March 2005
- Zerweck, Ulrich; Loppacher, Christian; Otto, Tobias
- Physical Review B, Vol. 71, Issue 12
Influence of Surface Adsorption on Work Function Measurements on Gold-Platinum Interface Using Scanning Kelvin Probe Microscopy
journal, July 2012
- Mugo, Simon; Yuan, Jun
- Journal of Physics: Conference Series, Vol. 371
Probing charge screening dynamics and electrochemical processes at the solid–liquid interface with electrochemical force microscopy
journal, May 2014
- Collins, Liam; Jesse, Stephen; Kilpatrick, Jason I.
- Nature Communications, Vol. 5, Issue 1
Characterization of Corrosion Interfaces by the Scanning Kelvin Probe Force Microscopy Technique
journal, January 2001
- Guillaumin, V.; Schmutz, P.; Frankel, G. S.
- Journal of The Electrochemical Society, Vol. 148, Issue 5
Geometric artefact suppressed surface potential measurements
journal, June 2006
- Lee, Minhwan; Lee, Wonyoung; Prinz, Fritz B.
- Nanotechnology, Vol. 17, Issue 15
Works referencing / citing this record:
Local electrical characterization of two-dimensional materials with functional atomic force microscopy
journal, January 2019
- Hussain, Sabir; Xu, Kunqi; Ye, Shili
- Frontiers of Physics, Vol. 14, Issue 3
Deep neural networks for understanding noisy data applied to physical property extraction in scanning probe microscopy
journal, February 2019
- Borodinov, Nikolay; Neumayer, Sabine; Kalinin, Sergei V.
- npj Computational Materials, Vol. 5, Issue 1
Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution
journal, May 2016
- Karatay, Durmus U.; Harrison, Jeffrey S.; Glaz, Micah S.
- Review of Scientific Instruments, Vol. 87, Issue 5
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy
journal, February 2016
- Collins, Liam; Belianinov, Alex; Somnath, Suhas
- Nanotechnology, Vol. 27, Issue 10
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review
journal, July 2018
- Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V.
- Reports on Progress in Physics, Vol. 81, Issue 8