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Title: Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy

Abstract

In this paper, nanomechanical properties are closely related to the states of matter, including chemical composition, crystal structure, mesoscopic domain configuration, etc. Investigation of these properties at the nanoscale requires not only static imaging methods, e.g., contact resonance atomic force microscopy (CR-AFM), but also spectroscopic methods capable of revealing their dependence on various external stimuli. Here we demonstrate the voltage spectroscopy of CR-AFM, which was realized by combining photothermal excitation (as opposed to the conventional piezoacoustic excitation method) with the band excitation technique. We applied this spectroscopy to explore local bias-induced phenomena ranging from purely physical to surface electromechanical and electrochemical processes. Our measurements show that the changes in the surface properties associated with these bias-induced transitions can be accurately assessed in a fast and dynamic manner, using resonance frequency as a signature. Finally, with many of the advantages offered by photothermal excitation, contact resonance voltage spectroscopy not only is expected to find applications in a broader field of nanoscience but also will provide a basis for future development of other nanoscale elastic spectroscopies.

Authors:
 [1];  [1];  [1];  [2];  [3];  [1];  [1];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
  2. University College Dublin, Belfield, Dublin (Ireland). School of Physics.
  3. Tsinghua Univ., Beijing (China). State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics.
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1265373
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
ACS Nano
Additional Journal Information:
Journal Volume: 9; Journal Issue: 2; Journal ID: ISSN 1936-0851
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; 77 NANOSCIENCE AND NANOTECHNOLOGY

Citation Formats

Li, Qian, Jesse, Stephen, Tselev, Alexander, Collins, Liam, Yu, Pu, Kravchenko, Ivan, Kalinin, Sergei V., and Balke, Nina. Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy. United States: N. p., 2015. Web. doi:10.1021/nn506753u.
Li, Qian, Jesse, Stephen, Tselev, Alexander, Collins, Liam, Yu, Pu, Kravchenko, Ivan, Kalinin, Sergei V., & Balke, Nina. Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy. United States. doi:10.1021/nn506753u.
Li, Qian, Jesse, Stephen, Tselev, Alexander, Collins, Liam, Yu, Pu, Kravchenko, Ivan, Kalinin, Sergei V., and Balke, Nina. Mon . "Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy". United States. doi:10.1021/nn506753u. https://www.osti.gov/servlets/purl/1265373.
@article{osti_1265373,
title = {Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy},
author = {Li, Qian and Jesse, Stephen and Tselev, Alexander and Collins, Liam and Yu, Pu and Kravchenko, Ivan and Kalinin, Sergei V. and Balke, Nina},
abstractNote = {In this paper, nanomechanical properties are closely related to the states of matter, including chemical composition, crystal structure, mesoscopic domain configuration, etc. Investigation of these properties at the nanoscale requires not only static imaging methods, e.g., contact resonance atomic force microscopy (CR-AFM), but also spectroscopic methods capable of revealing their dependence on various external stimuli. Here we demonstrate the voltage spectroscopy of CR-AFM, which was realized by combining photothermal excitation (as opposed to the conventional piezoacoustic excitation method) with the band excitation technique. We applied this spectroscopy to explore local bias-induced phenomena ranging from purely physical to surface electromechanical and electrochemical processes. Our measurements show that the changes in the surface properties associated with these bias-induced transitions can be accurately assessed in a fast and dynamic manner, using resonance frequency as a signature. Finally, with many of the advantages offered by photothermal excitation, contact resonance voltage spectroscopy not only is expected to find applications in a broader field of nanoscience but also will provide a basis for future development of other nanoscale elastic spectroscopies.},
doi = {10.1021/nn506753u},
journal = {ACS Nano},
number = 2,
volume = 9,
place = {United States},
year = {2015},
month = {1}
}

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