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Title: Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions

Abstract

Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above samplemore » model is provided as supporting information.« less

Authors:
 [1]
  1. George Washington Univ., Washington, DC (United States)
Publication Date:
Research Org.:
George Washington Univ., Washington, DC (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1262033
Grant/Contract Number:  
SC0011912
Resource Type:
Accepted Manuscript
Journal Name:
Beilstein Journal of Nanotechnology
Additional Journal Information:
Journal Volume: 7; Journal ID: ISSN 2190-4286
Publisher:
Beilstein Institute
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; atomic force microscopy; modeling; polymers; simulation; spectroscopy; standard linear solid; surface elasticity; surface energy; viscoelasticity; SI(111)-7X7

Citation Formats

Solares, Santiago D. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions. United States: N. p., 2016. Web. doi:10.3762/bjnano.7.49.
Solares, Santiago D. Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions. United States. doi:10.3762/bjnano.7.49.
Solares, Santiago D. Fri . "Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions". United States. doi:10.3762/bjnano.7.49. https://www.osti.gov/servlets/purl/1262033.
@article{osti_1262033,
title = {Nanoscale effects in the characterization of viscoelastic materials with atomic force microscopy: Coupling of a quasi-three-dimensional standard linear solid model with in-plane surface interactions},
author = {Solares, Santiago D.},
abstractNote = {Significant progress has been accomplished in the development of experimental contact-mode and dynamic-mode atomic force microscopy (AFM) methods designed to measure surface material properties. However, current methods are based on one-dimensional (1D) descriptions of the tip-sample interaction forces, thus neglecting the intricacies involved in the material behavior of complex samples (such as soft viscoelastic materials) as well as the differences in material response between the surface and the bulk. In order to begin to address this gap, a computational study is presented where the sample is simulated using an enhanced version of a recently introduced model that treats the surface as a collection of standard-linear-solid viscoelastic elements. The enhanced model introduces in-plane surface elastic forces that can be approximately related to a two-dimensional (2D) Young's modulus. Relevant cases are discussed for single-and multifrequency intermittent-contact AFM imaging, with focus on the calculated surface indentation profiles and tip-sample interaction force curves, as well as their implications with regards to experimental interpretation. A variety of phenomena are examined in detail, which highlight the need for further development of more physically accurate sample models that are specifically designed for AFM simulation. As a result, a multifrequency AFM simulation tool based on the above sample model is provided as supporting information.},
doi = {10.3762/bjnano.7.49},
journal = {Beilstein Journal of Nanotechnology},
number = ,
volume = 7,
place = {United States},
year = {2016},
month = {4}
}

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Works referenced in this record:

Energy dissipation in tapping-mode atomic force microscopy
journal, May 1998

  • Cleveland, J. P.; Anczykowski, B.; Schmid, A. E.
  • Applied Physics Letters, Vol. 72, Issue 20
  • DOI: 10.1063/1.121434

Vibrations of free and surface‐coupled atomic force microscope cantilevers: Theory and experiment
journal, September 1996

  • Rabe, U.; Janser, K.; Arnold, W.
  • Review of Scientific Instruments, Vol. 67, Issue 9
  • DOI: 10.1063/1.1147409

Contact-resonance atomic force microscopy for viscoelasticity
journal, January 2008

  • Yuya, P. A.; Hurley, D. C.; Turner, J. A.
  • Journal of Applied Physics, Vol. 104, Issue 7
  • DOI: 10.1063/1.2996259

Viscoelastic Property Mapping with Contact Resonance Force Microscopy
journal, December 2011

  • Killgore, J. P.; Yablon, D. G.; Tsou, A. H.
  • Langmuir, Vol. 27, Issue 23
  • DOI: 10.1021/la203434w

Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy
journal, May 2012


The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
journal, September 2007


Measurement and interpretation of elastic and viscoelastic properties with the atomic force microscope
journal, November 2007


The emergence of multifrequency force microscopy
journal, April 2012


Fast nanomechanical spectroscopy of soft matter
journal, January 2014

  • Herruzo, Elena T.; Perrino, Alma P.; Garcia, Ricardo
  • Nature Communications, Vol. 5, Issue 1
  • DOI: 10.1038/ncomms4126

The role of nonlinear dynamics in quantitative atomic force microscopy
journal, June 2012


Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy
journal, September 2013


Modeling viscoelasticity through spring–dashpot models in intermittent-contact atomic force microscopy
journal, January 2014

  • López-Guerra, Enrique A.; Solares, Santiago D.
  • Beilstein Journal of Nanotechnology, Vol. 5
  • DOI: 10.3762/bjnano.5.224

An atomic force microscope tip designed to measure time-varying nanomechanical forces
journal, July 2007

  • Sahin, Ozgur; Magonov, Sergei; Su, Chanmin
  • Nature Nanotechnology, Vol. 2, Issue 8
  • DOI: 10.1038/nnano.2007.226

Dynamic atomic force microscopy methods
journal, September 2002


Dynamic mechanical analysis of ethylene-propylene-diene monomer rubber and styrene-butadiene rubber blends
journal, April 2009

  • Nair, T. Muraleedharan; Kumaran, M. G.; Unnikrishnan, G.
  • Journal of Applied Polymer Science, Vol. 112, Issue 1
  • DOI: 10.1002/app.29367

Using force modulation to image surface elasticities with the atomic force microscope
journal, April 1991


Probing of Polymer Surfaces in the Viscoelastic Regime
journal, February 2014

  • Chyasnavichyus, Marius; Young, Seth L.; Tsukruk, Vladimir V.
  • Langmuir, Vol. 30, Issue 35
  • DOI: 10.1021/la404925h

Measuring the loss tangent of polymer materials with atomic force microscopy based methods
journal, March 2014


Inverting dynamic force microscopy: From signals to time-resolved interaction forces
journal, June 2002

  • Stark, M.; Stark, R. W.; Heckl, W. M.
  • Proceedings of the National Academy of Sciences, Vol. 99, Issue 13, p. 8473-8478
  • DOI: 10.1073/pnas.122040599

Density Functional Theory Study of the Geometry, Energetics, and Reconstruction Process of Si(111) Surfaces
journal, December 2005

  • Solares, Santiago D.; Dasgupta, Siddharth; Schultz, Peter A.
  • Langmuir, Vol. 21, Issue 26
  • DOI: 10.1021/la052029s

Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
journal, May 1985

  • Takayanagi, K.; Tanishiro, Y.; Takahashi, M.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 3, Issue 3
  • DOI: 10.1116/1.573160

Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
journal, December 1985


Nanoscale Interfacial Friction and Adhesion on Supported versus Suspended Monolayer and Multilayer Graphene
journal, December 2012

  • Deng, Zhao; Klimov, Nikolai N.; Solares, Santiago D.
  • Langmuir, Vol. 29, Issue 1
  • DOI: 10.1021/la304079a

Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient air
journal, January 2014

  • Solares, Santiago D.; An, Sangmin; Long, Christian J.
  • Beilstein Journal of Nanotechnology, Vol. 5
  • DOI: 10.3762/bjnano.5.175

Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever
journal, January 2004

  • Rodrı́guez, Tomás R.; Garcı́a, Ricardo
  • Applied Physics Letters, Vol. 84, Issue 3
  • DOI: 10.1063/1.1642273

Invited Article: VEDA: A web-based virtual environment for dynamic atomic force microscopy
journal, June 2008

  • Melcher, John; Hu, Shuiqing; Raman, Arvind
  • Review of Scientific Instruments, Vol. 79, Issue 6
  • DOI: 10.1063/1.2938864

Dynamic force microscopy simulator (dForce): A tool for planning and understanding tapping and bimodal AFM experiments
journal, January 2015

  • Guzman, Horacio V.; Garcia, Pablo D.; Garcia, Ricardo
  • Beilstein Journal of Nanotechnology, Vol. 6
  • DOI: 10.3762/bjnano.6.36

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