APT mass spectrometry and SEM data for CdTe solar cells
Abstract
Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl2 treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl2-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. As a result, these data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.
- Authors:
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE); USDOE Laboratory Directed Research and Development (LDRD) Program; USDOE Office of Science (SC)
- OSTI Identifier:
- 1324835
- Alternate Identifier(s):
- OSTI ID: 1261322
- Grant/Contract Number:
- FOA-0000492; AC05-00OR22725
- Resource Type:
- Published Article
- Journal Name:
- Data in Brief
- Additional Journal Information:
- Journal Name: Data in Brief Journal Volume: 7 Journal Issue: C; Journal ID: ISSN 2352-3409
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; scanning electron microscopy; atom probe tomography; mass spectroscopy; solar cells
Citation Formats
Poplawsky, Jonathan D., Li, Chen, Paudel, Naba R., Guo, Wei, Yan, Yanfa, and Pennycook, Stephen J. APT mass spectrometry and SEM data for CdTe solar cells. United States: N. p., 2016.
Web. doi:10.1016/j.dib.2016.03.042.
Poplawsky, Jonathan D., Li, Chen, Paudel, Naba R., Guo, Wei, Yan, Yanfa, & Pennycook, Stephen J. APT mass spectrometry and SEM data for CdTe solar cells. United States. https://doi.org/10.1016/j.dib.2016.03.042
Poplawsky, Jonathan D., Li, Chen, Paudel, Naba R., Guo, Wei, Yan, Yanfa, and Pennycook, Stephen J. Wed .
"APT mass spectrometry and SEM data for CdTe solar cells". United States. https://doi.org/10.1016/j.dib.2016.03.042.
@article{osti_1324835,
title = {APT mass spectrometry and SEM data for CdTe solar cells},
author = {Poplawsky, Jonathan D. and Li, Chen and Paudel, Naba R. and Guo, Wei and Yan, Yanfa and Pennycook, Stephen J.},
abstractNote = {Atom probe tomography (APT) data acquired from a CAMECA LEAP 4000 XHR for the CdS/CdTe interface for a non-CdCl2 treated CdTe solar cell as well as the mass spectrum of an APT data set including a GB in a CdCl2-treated CdTe solar cell are presented. Scanning electron microscopy (SEM) data showing the evolution of sample preparation for APT and scanning transmission electron microscopy (STEM) electron beam induced current (EBIC) are also presented. As a result, these data show mass spectrometry peak decomposition of Cu and Te within an APT dataset, the CdS/CdTe interface of an untreated CdTe solar cell, preparation of APT needles from the CdS/CdTe interface in superstrate grown CdTe solar cells, and the preparation of a cross-sectional STEM EBIC sample.},
doi = {10.1016/j.dib.2016.03.042},
journal = {Data in Brief},
number = C,
volume = 7,
place = {United States},
year = {Wed Jun 01 00:00:00 EDT 2016},
month = {Wed Jun 01 00:00:00 EDT 2016}
}
https://doi.org/10.1016/j.dib.2016.03.042