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Title: Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO 2) pixels, the spectrometer delivers a resolution near 25meV (FWHM) at 8981eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.
Authors:
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Publication Date:
Grant/Contract Number:
BMBF 05K13PE2k; BIDEB-2219
Type:
Accepted Manuscript
Journal Name:
Journal of Synchrotron Radiation (Online)
Additional Journal Information:
Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 22; Journal Issue: 4; Journal ID: ISSN 1600-5775
Publisher:
International Union of Crystallography
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; resonant inelastic X-ray scattering (RIXS); high energy-resolution; diced crystal analyzers; quartz
OSTI Identifier:
1261158

Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, and Yavaş, Hasan. Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge. United States: N. p., Web. doi:10.1107/s1600577515009686.
Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, & Yavaş, Hasan. Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge. United States. doi:10.1107/s1600577515009686.
Ketenoglu, Didem, Harder, Manuel, Klementiev, Konstantin, Upton, Mary, Taherkhani, Mehran, Spiwek, Manfred, Dill, Frank-Uwe, Wille, Hans-Christian, and Yavaş, Hasan. 2015. "Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge". United States. doi:10.1107/s1600577515009686. https://www.osti.gov/servlets/purl/1261158.
@article{osti_1261158,
title = {Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge},
author = {Ketenoglu, Didem and Harder, Manuel and Klementiev, Konstantin and Upton, Mary and Taherkhani, Mehran and Spiwek, Manfred and Dill, Frank-Uwe and Wille, Hans-Christian and Yavaş, Hasan},
abstractNote = {An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO2) pixels, the spectrometer delivers a resolution near 25meV (FWHM) at 8981eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.},
doi = {10.1107/s1600577515009686},
journal = {Journal of Synchrotron Radiation (Online)},
number = 4,
volume = 22,
place = {United States},
year = {2015},
month = {6}
}