X-ray metrology and performance of a 45-cm long x-ray deformable mirror
Abstract
We describe experiments with a 45-cm long x-ray deformable mirror (XDM) that have been conducted in End Station 2, Beamline 5.3.1 at the Advanced Light Source. A detailed description of the hardware implementation is provided. We explain our one-dimensional Fresnel propagation code that correctly handles grazing incidence and includes a model of the XDM. This code is used to simulate and verify experimental results. Initial long trace profiler metrology of the XDM at 7.5 keV is presented. The ability to measure a large (150-nm amplitude) height change on the XDM is demonstrated. The results agree well with the simulated experiment at an error level of 1 μrad RMS. Direct imaging of the x-ray beam also shows the expected change in intensity profile at the detector.
- Authors:
-
[1];
[2]
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1260489
- Alternate Identifier(s):
- OSTI ID: 1440927
- Report Number(s):
- LLNL-JRNL-678726
Journal ID: ISSN 0034-6748; RSINAK
- Grant/Contract Number:
- AC52-07NA27344; AC02-05CH11231
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 87; Journal Issue: 5; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; deformable mirror; x-ray metrology; adaptive optics; mirrors; photons; metrology; x-ray detectors; charge coupled devices
Citation Formats
Poyneer, Lisa A., Brejnholt, Nicolai F., Hill, Randall, Jackson, Jessie, Hagler, Lisle, Celestre, Richard, and Feng, Jun. X-ray metrology and performance of a 45-cm long x-ray deformable mirror. United States: N. p., 2016.
Web. doi:10.1063/1.4950739.
Poyneer, Lisa A., Brejnholt, Nicolai F., Hill, Randall, Jackson, Jessie, Hagler, Lisle, Celestre, Richard, & Feng, Jun. X-ray metrology and performance of a 45-cm long x-ray deformable mirror. United States. https://doi.org/10.1063/1.4950739
Poyneer, Lisa A., Brejnholt, Nicolai F., Hill, Randall, Jackson, Jessie, Hagler, Lisle, Celestre, Richard, and Feng, Jun. Fri .
"X-ray metrology and performance of a 45-cm long x-ray deformable mirror". United States. https://doi.org/10.1063/1.4950739. https://www.osti.gov/servlets/purl/1260489.
@article{osti_1260489,
title = {X-ray metrology and performance of a 45-cm long x-ray deformable mirror},
author = {Poyneer, Lisa A. and Brejnholt, Nicolai F. and Hill, Randall and Jackson, Jessie and Hagler, Lisle and Celestre, Richard and Feng, Jun},
abstractNote = {We describe experiments with a 45-cm long x-ray deformable mirror (XDM) that have been conducted in End Station 2, Beamline 5.3.1 at the Advanced Light Source. A detailed description of the hardware implementation is provided. We explain our one-dimensional Fresnel propagation code that correctly handles grazing incidence and includes a model of the XDM. This code is used to simulate and verify experimental results. Initial long trace profiler metrology of the XDM at 7.5 keV is presented. The ability to measure a large (150-nm amplitude) height change on the XDM is demonstrated. The results agree well with the simulated experiment at an error level of 1 μrad RMS. Direct imaging of the x-ray beam also shows the expected change in intensity profile at the detector.},
doi = {10.1063/1.4950739},
journal = {Review of Scientific Instruments},
number = 5,
volume = 87,
place = {United States},
year = {Fri May 20 00:00:00 EDT 2016},
month = {Fri May 20 00:00:00 EDT 2016}
}
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