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Title: Reflectance characterization of tape-based plasma mirrors

Authors:
 [1]; ORCiD logo [2];  [2];  [2]
  1. Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Applied Science and Technology, University of California, Berkeley, California 94720, USA
  2. Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1259727
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physics of Plasmas
Additional Journal Information:
Journal Name: Physics of Plasmas Journal Volume: 23 Journal Issue: 6; Journal ID: ISSN 1070-664X
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Shaw, B. H., Steinke, S., van Tilborg, J., and Leemans, W. P. Reflectance characterization of tape-based plasma mirrors. United States: N. p., 2016. Web. doi:10.1063/1.4954242.
Shaw, B. H., Steinke, S., van Tilborg, J., & Leemans, W. P. Reflectance characterization of tape-based plasma mirrors. United States. doi:10.1063/1.4954242.
Shaw, B. H., Steinke, S., van Tilborg, J., and Leemans, W. P. Tue . "Reflectance characterization of tape-based plasma mirrors". United States. doi:10.1063/1.4954242.
@article{osti_1259727,
title = {Reflectance characterization of tape-based plasma mirrors},
author = {Shaw, B. H. and Steinke, S. and van Tilborg, J. and Leemans, W. P.},
abstractNote = {},
doi = {10.1063/1.4954242},
journal = {Physics of Plasmas},
number = 6,
volume = 23,
place = {United States},
year = {2016},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1063/1.4954242

Citation Metrics:
Cited by: 4 works
Citation information provided by
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