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Title: Reflectance characterization of tape-based plasma mirrors

Authors:
 [1] ; ORCiD logo [2] ;  [2] ;  [2]
  1. Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA, Applied Science and Technology, University of California, Berkeley, California 94720, USA
  2. Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Physics of Plasmas
Additional Journal Information:
Journal Name: Physics of Plasmas Journal Volume: 23 Journal Issue: 6; Journal ID: ISSN 1070-664X
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1259727

Shaw, B. H., Steinke, S., van Tilborg, J., and Leemans, W. P.. Reflectance characterization of tape-based plasma mirrors. United States: N. p., Web. doi:10.1063/1.4954242.
Shaw, B. H., Steinke, S., van Tilborg, J., & Leemans, W. P.. Reflectance characterization of tape-based plasma mirrors. United States. doi:10.1063/1.4954242.
Shaw, B. H., Steinke, S., van Tilborg, J., and Leemans, W. P.. 2016. "Reflectance characterization of tape-based plasma mirrors". United States. doi:10.1063/1.4954242.
@article{osti_1259727,
title = {Reflectance characterization of tape-based plasma mirrors},
author = {Shaw, B. H. and Steinke, S. and van Tilborg, J. and Leemans, W. P.},
abstractNote = {},
doi = {10.1063/1.4954242},
journal = {Physics of Plasmas},
number = 6,
volume = 23,
place = {United States},
year = {2016},
month = {6}
}