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Title: Spherical quartz crystals investigated with synchrotron radiation

The quality of x-ray spectra and images obtained from plasmas with spherically bent crystals depends in part on the crystal's x-ray diffraction across the entire crystal surface. We employ the energy selectivity and high intensity of synchrotron radiation to examine typical spherical crystals from alpha-quartz for their diffraction quality, in a perpendicular geometry that is particularly convenient to examine sagittal focusing. The crystal's local diffraction is not ideal: the most noticeable problems come from isolated regions that so far have failed to correlate with visible imperfections. In conclusion, excluding diffraction from such problem spots has little effect on the focus beyond a decrease in background.
Authors:
ORCiD logo [1] ;  [2] ;  [3] ;  [4] ;  [5] ;  [5]
  1. Ecopulse, Inc., Springfield, VA (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
  4. Kurchatov Institute, Moscow (Russia)
  5. The Ohio State Univ., Columbus, OH (United States)
Publication Date:
Grant/Contract Number:
AC02-09CH11466
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Princeton Plasma Physics Lab. (PPPL), Princeton, NJ (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; instruments; instrumentation; X-ray diffraction; quartz; X-ray reflectometry; X-ray spectra; reflectivity
OSTI Identifier:
1259462