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Title: Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

Abstract

Here, all scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresis loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.

Authors:
 [1];  [2];  [3];  [3];  [4];  [1];  [2];  [2];  [2];  [2]
  1. Univ. de Lyon (France)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. Innovations for High Performance Microelectronics (IHP), Frankfurt (Germany)
  4. Univ. de Toulouse, Toulouse (France)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1259425
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 108; Journal Issue: 25; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE; atomic force microscopy; etching; mechanical properties; topography; nanostructures

Citation Formats

Mazet, Lucie, Jesse, Stephen, Niu, Gang, Schroeder, Thomas, Schamm-Chardon, Sylvie, Dubourdieu, Catherine, Baddorf, Arthur P., Kalinin, Sergei V., Yang, Sang Mo, and Okatan, M. Baris. Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy. United States: N. p., 2016. Web. https://doi.org/10.1063/1.4954276.
Mazet, Lucie, Jesse, Stephen, Niu, Gang, Schroeder, Thomas, Schamm-Chardon, Sylvie, Dubourdieu, Catherine, Baddorf, Arthur P., Kalinin, Sergei V., Yang, Sang Mo, & Okatan, M. Baris. Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy. United States. https://doi.org/10.1063/1.4954276
Mazet, Lucie, Jesse, Stephen, Niu, Gang, Schroeder, Thomas, Schamm-Chardon, Sylvie, Dubourdieu, Catherine, Baddorf, Arthur P., Kalinin, Sergei V., Yang, Sang Mo, and Okatan, M. Baris. Mon . "Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy". United States. https://doi.org/10.1063/1.4954276. https://www.osti.gov/servlets/purl/1259425.
@article{osti_1259425,
title = {Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy},
author = {Mazet, Lucie and Jesse, Stephen and Niu, Gang and Schroeder, Thomas and Schamm-Chardon, Sylvie and Dubourdieu, Catherine and Baddorf, Arthur P. and Kalinin, Sergei V. and Yang, Sang Mo and Okatan, M. Baris},
abstractNote = {Here, all scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresis loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.},
doi = {10.1063/1.4954276},
journal = {Applied Physics Letters},
number = 25,
volume = 108,
place = {United States},
year = {2016},
month = {6}
}

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