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Title: Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

Here, all scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO 3 deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresis loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.
 [1] ;  [2] ;  [3] ;  [3] ;  [4] ;  [1] ;  [2] ;  [2] ;  [2] ;  [2]
  1. Univ. de Lyon (France)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. Innovations for High Performance Microelectronics (IHP), Frankfurt (Germany)
  4. Univ. de Toulouse, Toulouse (France)
Publication Date:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 108; Journal Issue: 25; Journal ID: ISSN 0003-6951
American Institute of Physics (AIP)
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE; atomic force microscopy; etching; mechanical properties; topography; nanostructures
OSTI Identifier: