Built-in Electric Field Induced Mechanical Property Change at the Lanthanum Nickelate/Nb-doped Strontium Titanate Interfaces
Abstract
The interactions between electric field and the mechanical properties of materials are important for the applications of microelectromechanical and nanoelectromechanical systems, but relatively unexplored for nanoscale materials. Here, we observe an apparent correlation between the change of the fractured topography of Nb-doped SrTiO3 (Nb:STO) within the presence of a built-in electric field resulting from the Schottky contact at the interface of a metallic LaNiO3 thin film utilizing cross-sectional scanning tunneling microscopy and spectroscopy. The change of the inter-atomic bond length mechanism is argued to be the most plausible origin. This picture is supported by the strong-electric-field-dependent permittivity in STO and the existence of the dielectric dead layer at the interfaces of STO with metallic films. Finally, these results provided direct evidence and a possible mechanism for the interplay between the electric field and the mechanical properties on the nanoscale for perovskite materials.
- Authors:
-
- Univ. of Wyoming, Laramie, WY (United States)
- Univ. of Arkansas, Fayetteville, AR (United States); Univ. of Tennessee, Knoxville, TN (United States)
- Univ. of Arkansas, Fayetteville, AR (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
- Publication Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Biological and Environmental Research (BER); USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1258610
- Alternate Identifier(s):
- OSTI ID: 1258770
- Grant/Contract Number:
- FG02-10ER46728; SC0004981; AC02-06CH11357
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Scientific Reports
- Additional Journal Information:
- Journal Volume: 6; Journal ID: ISSN 2045-2322
- Publisher:
- Nature Publishing Group
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; mechanical engineering; surfaces, interfaces and thin films
Citation Formats
Chien, TeYu, Liu, Jian, Yost, Andrew J., Chakhalian, Jak, Freeland, John W., and Guisinger, Nathan P. Built-in Electric Field Induced Mechanical Property Change at the Lanthanum Nickelate/Nb-doped Strontium Titanate Interfaces. United States: N. p., 2016.
Web. doi:10.1038/srep19017.
Chien, TeYu, Liu, Jian, Yost, Andrew J., Chakhalian, Jak, Freeland, John W., & Guisinger, Nathan P. Built-in Electric Field Induced Mechanical Property Change at the Lanthanum Nickelate/Nb-doped Strontium Titanate Interfaces. United States. https://doi.org/10.1038/srep19017
Chien, TeYu, Liu, Jian, Yost, Andrew J., Chakhalian, Jak, Freeland, John W., and Guisinger, Nathan P. Fri .
"Built-in Electric Field Induced Mechanical Property Change at the Lanthanum Nickelate/Nb-doped Strontium Titanate Interfaces". United States. https://doi.org/10.1038/srep19017. https://www.osti.gov/servlets/purl/1258610.
@article{osti_1258610,
title = {Built-in Electric Field Induced Mechanical Property Change at the Lanthanum Nickelate/Nb-doped Strontium Titanate Interfaces},
author = {Chien, TeYu and Liu, Jian and Yost, Andrew J. and Chakhalian, Jak and Freeland, John W. and Guisinger, Nathan P.},
abstractNote = {The interactions between electric field and the mechanical properties of materials are important for the applications of microelectromechanical and nanoelectromechanical systems, but relatively unexplored for nanoscale materials. Here, we observe an apparent correlation between the change of the fractured topography of Nb-doped SrTiO3 (Nb:STO) within the presence of a built-in electric field resulting from the Schottky contact at the interface of a metallic LaNiO3 thin film utilizing cross-sectional scanning tunneling microscopy and spectroscopy. The change of the inter-atomic bond length mechanism is argued to be the most plausible origin. This picture is supported by the strong-electric-field-dependent permittivity in STO and the existence of the dielectric dead layer at the interfaces of STO with metallic films. Finally, these results provided direct evidence and a possible mechanism for the interplay between the electric field and the mechanical properties on the nanoscale for perovskite materials.},
doi = {10.1038/srep19017},
journal = {Scientific Reports},
number = ,
volume = 6,
place = {United States},
year = {Fri Jan 08 00:00:00 EST 2016},
month = {Fri Jan 08 00:00:00 EST 2016}
}
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