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Title: An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics

X-ray phase-contrast techniques can measure electron density gradients in high-energy-density plasmas through refraction induced phase shifts. An 8 keV Talbot-Lau interferometer consisting of free standing ultrathin gratings was deployed at an ultra-short, high-intensity laser system using K-shell emission from a 1-30 J, 8 ps laser pulse focused on thin Cu foil targets. Grating survival was demonstrated for 30 J, 8 ps laser pulses. The first x-ray deflectometry images obtained under laser backlighting showed up to 25% image contrast and thus enabled detection of electron areal density gradients with a maximum value of 8.1 ± 0.5 × 10 23 cm ₋3 in a low-Z millimeter sized sample. An electron density profile was obtained from refraction measurements with an error of <8%. We found the 50 ± 15 μm spatial resolution achieved across the full field of view was limited by the x-ray source-size, similar to conventional radiography.
Authors:
 [1] ;  [1] ;  [2] ;  [2] ;  [2] ;  [2] ;  [2] ;  [2]
  1. Johns Hopkins Univ., Baltimore, MD (United States). Department of Physics and Astronomy
  2. Univ. of Rochester, NY (United States). Lab. for Laser Energetics
Publication Date:
Grant/Contract Number:
NA0001835; DENA0001835
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Johns Hopkins Univ., Baltimore, MD (United States). Department of Physics and Astronomy
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
OSTI Identifier:
1258591
Alternate Identifier(s):
OSTI ID: 1237775

Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Mileham, C., Begishev, I. A., Bromage, J., and Regan, S. P.. An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics. United States: N. p., Web. doi:10.1063/1.4941441.
Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Mileham, C., Begishev, I. A., Bromage, J., & Regan, S. P.. An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics. United States. doi:10.1063/1.4941441.
Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Mileham, C., Begishev, I. A., Bromage, J., and Regan, S. P.. 2016. "An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics". United States. doi:10.1063/1.4941441. https://www.osti.gov/servlets/purl/1258591.
@article{osti_1258591,
title = {An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics},
author = {Valdivia, M. P. and Stutman, D. and Stoeckl, C. and Theobald, W. and Mileham, C. and Begishev, I. A. and Bromage, J. and Regan, S. P.},
abstractNote = {X-ray phase-contrast techniques can measure electron density gradients in high-energy-density plasmas through refraction induced phase shifts. An 8 keV Talbot-Lau interferometer consisting of free standing ultrathin gratings was deployed at an ultra-short, high-intensity laser system using K-shell emission from a 1-30 J, 8 ps laser pulse focused on thin Cu foil targets. Grating survival was demonstrated for 30 J, 8 ps laser pulses. The first x-ray deflectometry images obtained under laser backlighting showed up to 25% image contrast and thus enabled detection of electron areal density gradients with a maximum value of 8.1 ± 0.5 × 1023 cm₋3 in a low-Z millimeter sized sample. An electron density profile was obtained from refraction measurements with an error of <8%. We found the 50 ± 15 μm spatial resolution achieved across the full field of view was limited by the x-ray source-size, similar to conventional radiography.},
doi = {10.1063/1.4941441},
journal = {Review of Scientific Instruments},
number = 2,
volume = 87,
place = {United States},
year = {2016},
month = {2}
}