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Title: Achieving highly-enhanced UV photoluminescence and its origin in ZnO nanocrystalline films

Authors:
; ; ; ; ;
Publication Date:
Research Org.:
Washington State Univ., Pullman, WA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
OSTI Identifier:
1257289
Alternate Identifier(s):
OSTI ID: 1434897; OSTI ID: 1489139
Grant/Contract Number:  
FG02-07ER46386
Resource Type:
Published Article
Journal Name:
Optical Materials
Additional Journal Information:
Journal Name: Optical Materials Journal Volume: 58 Journal Issue: C; Journal ID: ISSN 0925-3467
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; ZnOUV-photoluminescence; DC-sputtering; Raman; Native defects; Annealing

Citation Formats

Thapa, Dinesh, Huso, Jesse, Morrison, John L., Corolewski, Caleb D., McCluskey, Matthew D., and Bergman, Leah. Achieving highly-enhanced UV photoluminescence and its origin in ZnO nanocrystalline films. Netherlands: N. p., 2016. Web. doi:10.1016/j.optmat.2016.05.008.
Thapa, Dinesh, Huso, Jesse, Morrison, John L., Corolewski, Caleb D., McCluskey, Matthew D., & Bergman, Leah. Achieving highly-enhanced UV photoluminescence and its origin in ZnO nanocrystalline films. Netherlands. doi:10.1016/j.optmat.2016.05.008.
Thapa, Dinesh, Huso, Jesse, Morrison, John L., Corolewski, Caleb D., McCluskey, Matthew D., and Bergman, Leah. Mon . "Achieving highly-enhanced UV photoluminescence and its origin in ZnO nanocrystalline films". Netherlands. doi:10.1016/j.optmat.2016.05.008.
@article{osti_1257289,
title = {Achieving highly-enhanced UV photoluminescence and its origin in ZnO nanocrystalline films},
author = {Thapa, Dinesh and Huso, Jesse and Morrison, John L. and Corolewski, Caleb D. and McCluskey, Matthew D. and Bergman, Leah},
abstractNote = {},
doi = {10.1016/j.optmat.2016.05.008},
journal = {Optical Materials},
number = C,
volume = 58,
place = {Netherlands},
year = {2016},
month = {8}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.optmat.2016.05.008

Citation Metrics:
Cited by: 7 works
Citation information provided by
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Figures / Tables:

Fig. 1. Fig. 1.: SEM image of ZnO films: (a) as-grown, (b) O2 annealed, and (c) Ar annealed, under low and high magnifications showing their surface morphology.

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