Measuring the diffraction properties of an imaging quartz(211) crystal
- Authors:
-
[1]
; [1]
; [1]
; [2]
; [3]
; [2]
- National Security Technologies, LLC, Livermore, California 94550, USA
- Lawrence Livermore National Laboratory, 7000 East Avenue, Livermore, California 94550, USA
- Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA
- Publication Date:
- Grant/Contract Number:
- AC52-06NA25946
- Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Name: Review of Scientific Instruments Journal Volume: 87 Journal Issue: 6; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics
- Sponsoring Org:
- USDOE
- Country of Publication:
- United States
- Language:
- English
- OSTI Identifier:
- 1255628
Haugh, M. J., Jacoby, K. D., Koch, J. A., Chen, H., Hill, K. W., and Schneider, M. B.. Measuring the diffraction properties of an imaging quartz(211) crystal. United States: N. p.,
Web. doi:10.1063/1.4952746.
Haugh, M. J., Jacoby, K. D., Koch, J. A., Chen, H., Hill, K. W., & Schneider, M. B.. Measuring the diffraction properties of an imaging quartz(211) crystal. United States. doi:10.1063/1.4952746.
Haugh, M. J., Jacoby, K. D., Koch, J. A., Chen, H., Hill, K. W., and Schneider, M. B.. 2016.
"Measuring the diffraction properties of an imaging quartz(211) crystal". United States.
doi:10.1063/1.4952746.
@article{osti_1255628,
title = {Measuring the diffraction properties of an imaging quartz(211) crystal},
author = {Haugh, M. J. and Jacoby, K. D. and Koch, J. A. and Chen, H. and Hill, K. W. and Schneider, M. B.},
abstractNote = {},
doi = {10.1063/1.4952746},
journal = {Review of Scientific Instruments},
number = 6,
volume = 87,
place = {United States},
year = {2016},
month = {6}
}