Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1254668
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Solar Energy Materials and Solar Cells
- Additional Journal Information:
- Journal Name: Solar Energy Materials and Solar Cells Journal Volume: 132 Journal Issue: C; Journal ID: ISSN 0927-0248
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Jiang, C. -S., Repins, I. L., Beall, C., Moutinho, H. R., Ramanathan, K., and Al-Jassim, M. M. Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy. Netherlands: N. p., 2015.
Web. doi:10.1016/j.solmat.2014.08.046.
Jiang, C. -S., Repins, I. L., Beall, C., Moutinho, H. R., Ramanathan, K., & Al-Jassim, M. M. Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy. Netherlands. https://doi.org/10.1016/j.solmat.2014.08.046
Jiang, C. -S., Repins, I. L., Beall, C., Moutinho, H. R., Ramanathan, K., and Al-Jassim, M. M. Thu .
"Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy". Netherlands. https://doi.org/10.1016/j.solmat.2014.08.046.
@article{osti_1254668,
title = {Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy},
author = {Jiang, C. -S. and Repins, I. L. and Beall, C. and Moutinho, H. R. and Ramanathan, K. and Al-Jassim, M. M.},
abstractNote = {},
doi = {10.1016/j.solmat.2014.08.046},
journal = {Solar Energy Materials and Solar Cells},
number = C,
volume = 132,
place = {Netherlands},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}
Free Publicly Available Full Text
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https://doi.org/10.1016/j.solmat.2014.08.046
https://doi.org/10.1016/j.solmat.2014.08.046
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Cited by: 22 works
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