skip to main content

DOE PAGESDOE PAGES

Title: Depth resolved domain mapping in tetragonal SrTiO 3 by micro-Laue diffraction

Here, we present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO 3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations ( x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.
Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [3] ;  [2] ;  [2] ;  [2] ;  [2]
  1. Stanford Univ., Stanford, CA (United States)
  2. Stanford Univ., Stanford, CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Report Number(s):
SLAC-PUB-16523
Journal ID: ISSN 0003-6951
Grant/Contract Number:
AC02-76SF00515; AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 108; Journal Issue: 18; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; PHYS; SrTiO3; tetragonal; strain; micro-Laue diffraction
OSTI Identifier:
1253090
Alternate Identifier(s):
OSTI ID: 1250391

Merz, T. A., Noad, H., Xu, R., Inoue, H., Liu, W., Hikita, Y., Vailionis, A., Moler, K. A., and Hwang, H. Y.. Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction. United States: N. p., Web. doi:10.1063/1.4948351.
Merz, T. A., Noad, H., Xu, R., Inoue, H., Liu, W., Hikita, Y., Vailionis, A., Moler, K. A., & Hwang, H. Y.. Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction. United States. doi:10.1063/1.4948351.
Merz, T. A., Noad, H., Xu, R., Inoue, H., Liu, W., Hikita, Y., Vailionis, A., Moler, K. A., and Hwang, H. Y.. 2016. "Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction". United States. doi:10.1063/1.4948351. https://www.osti.gov/servlets/purl/1253090.
@article{osti_1253090,
title = {Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction},
author = {Merz, T. A. and Noad, H. and Xu, R. and Inoue, H. and Liu, W. and Hikita, Y. and Vailionis, A. and Moler, K. A. and Hwang, H. Y.},
abstractNote = {Here, we present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.},
doi = {10.1063/1.4948351},
journal = {Applied Physics Letters},
number = 18,
volume = 108,
place = {United States},
year = {2016},
month = {5}
}

Works referenced in this record:

Three-dimensional X-ray structural microscopy with submicrometre resolution
journal, February 2002
  • Larson, B. C.; Yang, Wenge; Ice, G. E.
  • Nature, Vol. 415, p. 887-890
  • DOI: 10.1038/415887a