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Title: TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis

Authors:
; ; ; ;
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Micron
Additional Journal Information:
Journal Name: Micron Journal Volume: 71 Journal Issue: C; Journal ID: ISSN 0968-4328
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
United Kingdom
Language:
English
OSTI Identifier:
1250905

Kim, Kyou-Hyun, Xing, Hui, Zuo, Jian-Min, Zhang, Peng, and Wang, Haifeng. TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis. United Kingdom: N. p., Web. doi:10.1016/j.micron.2015.01.002.
Kim, Kyou-Hyun, Xing, Hui, Zuo, Jian-Min, Zhang, Peng, & Wang, Haifeng. TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis. United Kingdom. doi:10.1016/j.micron.2015.01.002.
Kim, Kyou-Hyun, Xing, Hui, Zuo, Jian-Min, Zhang, Peng, and Wang, Haifeng. 2015. "TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis". United Kingdom. doi:10.1016/j.micron.2015.01.002.
@article{osti_1250905,
title = {TEM based high resolution and low-dose scanning electron nanodiffraction technique for nanostructure imaging and analysis},
author = {Kim, Kyou-Hyun and Xing, Hui and Zuo, Jian-Min and Zhang, Peng and Wang, Haifeng},
abstractNote = {},
doi = {10.1016/j.micron.2015.01.002},
journal = {Micron},
number = C,
volume = 71,
place = {United Kingdom},
year = {2015},
month = {4}
}