3D reconstruction of nanocrystalline particles from a single projection
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1250595
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Micron
- Additional Journal Information:
- Journal Name: Micron Journal Volume: 68 Journal Issue: C; Journal ID: ISSN 0968-4328
- Publisher:
- Elsevier
- Country of Publication:
- United Kingdom
- Language:
- English
Citation Formats
Chen, F. -R., Kisielowski, C., and Van Dyck, D. 3D reconstruction of nanocrystalline particles from a single projection. United Kingdom: N. p., 2015.
Web. doi:10.1016/j.micron.2014.08.009.
Chen, F. -R., Kisielowski, C., & Van Dyck, D. 3D reconstruction of nanocrystalline particles from a single projection. United Kingdom. https://doi.org/10.1016/j.micron.2014.08.009
Chen, F. -R., Kisielowski, C., and Van Dyck, D. Thu .
"3D reconstruction of nanocrystalline particles from a single projection". United Kingdom. https://doi.org/10.1016/j.micron.2014.08.009.
@article{osti_1250595,
title = {3D reconstruction of nanocrystalline particles from a single projection},
author = {Chen, F. -R. and Kisielowski, C. and Van Dyck, D.},
abstractNote = {},
doi = {10.1016/j.micron.2014.08.009},
journal = {Micron},
number = C,
volume = 68,
place = {United Kingdom},
year = {Thu Jan 01 00:00:00 EST 2015},
month = {Thu Jan 01 00:00:00 EST 2015}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1016/j.micron.2014.08.009
https://doi.org/10.1016/j.micron.2014.08.009
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Cited by: 16 works
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Works referenced in this record:
A simple intuitive theory for electron diffraction
journal, August 1996
- Van Dyck, D.; Op de Beeck, M.
- Ultramicroscopy, Vol. 64, Issue 1-4
Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
journal, March 2010
- Krivanek, Ondrej L.; Chisholm, Matthew F.; Nicolosi, Valeria
- Nature, Vol. 464, Issue 7288
A simple channelling model for HREM contrast transfer under dynamical conditions: A SIMPLE CHANNELLING MODEL
journal, April 1999
- Sinkler,
- Journal of Microscopy, Vol. 194, Issue 1
Quantitative atomic 3-D imaging of single/double sheet graphene structure
journal, February 2011
- Jinschek, Joerg R.; Yucelen, Emrah; Calderon, Hector A.
- Carbon, Vol. 49, Issue 2
Electron tomography at 2.4-ångström resolution
journal, March 2012
- Scott, M. C.; Chen, Chien-Chun; Mecklenburg, Matthew
- Nature, Vol. 483, Issue 7390
Calculation of the mean inner potential
journal, January 1985
- Sanchez, A.; Ochando, M. A.
- Journal of Physics C: Solid State Physics, Vol. 18, Issue 1
Graphene at the Edge: Stability and Dynamics
journal, March 2009
- Girit, C. O.; Meyer, J. C.; Erni, R.
- Science, Vol. 323, Issue 5922
Direct structure inversion from exit waves
journal, April 2010
- Wang, A.; Chen, F. R.; Van Aert, S.
- Ultramicroscopy, Vol. 110, Issue 5
‘Big Bang’ tomography as a new route to atomic-resolution electron tomography
journal, June 2012
- Van Dyck, Dirk; Jinschek, Joerg R.; Chen, Fu-Rong
- Nature, Vol. 486, Issue 7402
Real-time sub- ngstrom imaging of reversible and irreversible conformations in rhodium catalysts and graphene
journal, July 2013
- Kisielowski, Christian; Wang, Lin-Wang; Specht, Petra
- Physical Review B, Vol. 88, Issue 2
Using a monochromator to improve the resolution in TEM to below 0.5Å. Part II: Application to focal series reconstruction
journal, July 2012
- Tiemeijer, P. C.; Bischoff, M.; Freitag, B.
- Ultramicroscopy, Vol. 118
Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy
journal, July 2009
- Alloyeau, D.; Freitag, B.; Dag, S.
- Physical Review B, Vol. 80, Issue 1
Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage
journal, July 2009
- Suenaga, Kazu; Sato, Yuta; Liu, Zheng
- Nature Chemistry, Vol. 1, Issue 5
Can the Multislice Method Be Used To Calculate HOLZ Reflections in High-Energy Electron Diffraction and Imaging?
journal, January 1996
- Chen, Jiang Hua; Op de Beeck, Marc; Van Dyck, Dirk
- Microscopy Microanalysis Microstructures, Vol. 7, Issue 1, p. 27-47
Resolution extension and exit wave reconstruction in complex HREM
journal, January 2004
- Hsieh, Wen-Kuo; Chen, Fu-Rong; Kai, Ji-Jung
- Ultramicroscopy, Vol. 98, Issue 2-4
3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography
journal, May 2008
- Jinschek, J. R.; Batenburg, K. J.; Calderon, H. A.
- Ultramicroscopy, Vol. 108, Issue 6
Radiation damage in the TEM and SEM
journal, August 2004
- Egerton, R. F.; Li, P.; Malac, M.
- Micron, Vol. 35, Issue 6
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
journal, September 2008
- Kisielowski, C.; Freitag, B.; Bischoff, M.
- Microscopy and Microanalysis, Vol. 14, Issue 5
Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
journal, August 1996
- Coene, W. M. J.; Thust, A.; Op de Beeck, M.
- Ultramicroscopy, Vol. 64, Issue 1-4