skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Structure retrieval with fast electrons using segmented detectors

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1249952
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Name: Physical Review B Journal Volume: 93 Journal Issue: 13; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society
Country of Publication:
United States
Language:
English

Citation Formats

Brown, H. G., D'Alfonso, A. J., Chen, Z., Morgan, A. J., Weyland, M., Zheng, C., Fuhrer, M. S., Findlay, S. D., and Allen, L. J. Structure retrieval with fast electrons using segmented detectors. United States: N. p., 2016. Web. doi:10.1103/PhysRevB.93.134116.
Brown, H. G., D'Alfonso, A. J., Chen, Z., Morgan, A. J., Weyland, M., Zheng, C., Fuhrer, M. S., Findlay, S. D., & Allen, L. J. Structure retrieval with fast electrons using segmented detectors. United States. doi:10.1103/PhysRevB.93.134116.
Brown, H. G., D'Alfonso, A. J., Chen, Z., Morgan, A. J., Weyland, M., Zheng, C., Fuhrer, M. S., Findlay, S. D., and Allen, L. J. Wed . "Structure retrieval with fast electrons using segmented detectors". United States. doi:10.1103/PhysRevB.93.134116.
@article{osti_1249952,
title = {Structure retrieval with fast electrons using segmented detectors},
author = {Brown, H. G. and D'Alfonso, A. J. and Chen, Z. and Morgan, A. J. and Weyland, M. and Zheng, C. and Fuhrer, M. S. and Findlay, S. D. and Allen, L. J.},
abstractNote = {},
doi = {10.1103/PhysRevB.93.134116},
journal = {Physical Review B},
number = 13,
volume = 93,
place = {United States},
year = {2016},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevB.93.134116

Citation Metrics:
Cited by: 5 works
Citation information provided by
Web of Science

Save / Share:

Works referenced in this record:

Nonstandard imaging methods in electron microscopy
journal, January 1976


Two-Dimensional Transition Metal Dichalcogenides under Electron Irradiation: Defect Production and Doping
journal, July 2012


The scattering of high-energy electrons. II. Quantitative validity domains of the single-scattering approximations for organic crystals
journal, January 1980


Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions
journal, April 2015


Deterministic electron ptychography at atomic resolution
journal, February 2014


When to use the projection assumption and the weak-phase object approximation in phase contrast cryo-EM
journal, January 2014


Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy
journal, June 2015

  • Shibata, Naoya; Findlay, Scott D.; Sasaki, Hirokazu
  • Scientific Reports, Vol. 5, Issue 1
  • DOI: 10.1038/srep10040

Pseudo-weak-phase-object approximation in high-resolution electron microscopy. I. Theory
journal, July 1985

  • Li, F. H.; Tang, D.
  • Acta Crystallographica Section A Foundations of Crystallography, Vol. 41, Issue 4
  • DOI: 10.1107/S0108767385000800

On the validity of the weak-phase and other approximations in the analysis of electron microscope images
journal, September 1976


Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging
journal, January 2012

  • Humphry, M. J.; Kraus, B.; Hurst, A. C.
  • Nature Communications, Vol. 3, Issue 1
  • DOI: 10.1038/ncomms1733

Atom-Scale Ptychographic Electron Diffractive Imaging of Boron Nitride Cones
journal, February 2012


Modelling the inelastic scattering of fast electrons
journal, April 2015


Fast deterministic single-exposure coherent diffractive imaging at sub-Ångström resolution
journal, March 2013


Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
journal, April 2015


Phase contrast STEM for thin samples: Integrated differential phase contrast
journal, January 2016


Ptychographic inversion via Wigner distribution deconvolution: Noise suppression and probe design
journal, December 2014


A versatile, software configurable multichannel STEM detector for angle-resolved imaging
journal, May 1994


Differential phase contrast microscopy of magnetic materials
journal, December 1992


The scattering of electrons by atoms and crystals. I. A new theoretical approach
journal, October 1957


Differential phase-contrast microscopy at atomic resolution
journal, June 2012

  • Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji
  • Nature Physics, Vol. 8, Issue 8
  • DOI: 10.1038/nphys2337

New area detector for atomic-resolution scanning transmission electron microscopy
journal, April 2010

  • Shibata, N.; Kohno, Y.; Findlay, S. D.
  • Journal of Electron Microscopy, Vol. 59, Issue 6
  • DOI: 10.1093/jmicro/dfq014

Recording and Using 4D-STEM Datasets in Materials Science
journal, August 2014

  • Ophus, Colin; Ercius, Peter; Sarahan, Michael
  • Microscopy and Microanalysis, Vol. 20, Issue S3
  • DOI: 10.1017/S1431927614002037

Fast Deterministic Ptychographic Imaging Using X-Rays
journal, May 2014

  • Yan, Ada W. C.; D’Alfonso, Adrian J.; Morgan, Andrew J.
  • Microscopy and Microanalysis, Vol. 20, Issue 4
  • DOI: 10.1017/S1431927614000932

A useful approximation of the exit wave function in coherent STEM
journal, August 1995


Diffraction contrast imaging using virtual apertures
journal, August 2015


4D STEM: High efficiency phase contrast imaging using a fast pixelated detector
journal, October 2015


Inelastic scattering of high-energy electrons in real space
journal, October 1990


Position averaged convergent beam electron diffraction: Theory and applications
journal, January 2010