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Title: Full elastic strain and stress tensor measurements from individual dislocation cells in copper through-Si vias

Abstract

We report non-destructive measurements of the full elastic strain and stress tensors from individual dislocation cells distributed along the full extent of a 50 mm-long polycrystalline copper via in Si is reported. Determining all of the components of these tensors from sub-micrometre regions within deformed metals presents considerable challenges. The primary issues are ensuring that different diffraction peaks originate from the same sample volume and that accurate determination is made of the peak positions from plastically deformed samples. For these measurements, three widely separated reflections were examined from selected, individual grains along the via. The lattice spacings and peak positions were measured for multiple dislocation cell interiors within each grain and the cell-interior peaks were sorted out using the measured included angles. A comprehensive uncertainty analysis using a Monte Carlo uncertainty algorithm provided uncertainties for the elastic strain tensor and stress tensor components.

Authors:
 [1];  [2];  [3]
  1. National Institute of Standards and Technology, Gaithersburg, MD (United States)
  2. National Institute of Standard and Technology, Gaithersburg, MD (United States)
  3. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1248965
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
IUCrJ
Additional Journal Information:
Journal Volume: 2; Journal Issue: 6; Journal ID: ISSN 2052-2525
Publisher:
International Union of Crystallography
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; microelectronics; copper through-Si vias; full elastic strain; stress tensor measurement

Citation Formats

Levine, Lyle E., Okoro, Chukwudi A., and Xu, Ruqing. Full elastic strain and stress tensor measurements from individual dislocation cells in copper through-Si vias. United States: N. p., 2015. Web. doi:10.1107/S2052252515015031.
Levine, Lyle E., Okoro, Chukwudi A., & Xu, Ruqing. Full elastic strain and stress tensor measurements from individual dislocation cells in copper through-Si vias. United States. https://doi.org/10.1107/S2052252515015031
Levine, Lyle E., Okoro, Chukwudi A., and Xu, Ruqing. Wed . "Full elastic strain and stress tensor measurements from individual dislocation cells in copper through-Si vias". United States. https://doi.org/10.1107/S2052252515015031. https://www.osti.gov/servlets/purl/1248965.
@article{osti_1248965,
title = {Full elastic strain and stress tensor measurements from individual dislocation cells in copper through-Si vias},
author = {Levine, Lyle E. and Okoro, Chukwudi A. and Xu, Ruqing},
abstractNote = {We report non-destructive measurements of the full elastic strain and stress tensors from individual dislocation cells distributed along the full extent of a 50 mm-long polycrystalline copper via in Si is reported. Determining all of the components of these tensors from sub-micrometre regions within deformed metals presents considerable challenges. The primary issues are ensuring that different diffraction peaks originate from the same sample volume and that accurate determination is made of the peak positions from plastically deformed samples. For these measurements, three widely separated reflections were examined from selected, individual grains along the via. The lattice spacings and peak positions were measured for multiple dislocation cell interiors within each grain and the cell-interior peaks were sorted out using the measured included angles. A comprehensive uncertainty analysis using a Monte Carlo uncertainty algorithm provided uncertainties for the elastic strain tensor and stress tensor components.},
doi = {10.1107/S2052252515015031},
journal = {IUCrJ},
number = 6,
volume = 2,
place = {United States},
year = {Wed Sep 30 00:00:00 EDT 2015},
month = {Wed Sep 30 00:00:00 EDT 2015}
}

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Cited by: 15 works
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Unexpected δ-Phase Formation in Additive-Manufactured Ni-Based Superalloy
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High Resolution Mapping of Orientation and Strain Gradients in Metals by Synchrotron 3D X-ray Laue Microdiffraction
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