skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators

Abstract

We report on the growth and characterization of several sapphire single crystals for the purpose of x-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique with a dislocation density of 10 2-10 3 cm -2 and a small area with approximately 2*2 mm 2 did not show dislocation contrast in many reflections and has suitable quality for application as a backscattering monochromator. As a result, a clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.

Authors:
 [1];  [2];  [2];  [2];  [2];  [3];  [2];  [2];  [2];  [4];  [5];  [6];  [6];  [7];  [8];  [9];  [9];  [10]
  1. Shubnikov Institute for Crystallography RAS, Moscow (Russia); Lomonosov Moscow State Univ., Moscow (Russia)
  2. Shubnikov Institute for Crystallography RAS, Moscow (Russia)
  3. Institute for Crystallography RAS, Kaluga (Russia)
  4. Julich Center for Neutron Science (JCNS) and Peter Grunberg Institute PGI, Julich (Germany); Univ. of Liege, Liege (Belgium); European Synchrotron Radiation Facility, Grenoble (France)
  5. Julich Center for Neutron Science (JCNS) and Peter Grunberg Institute PGI, Julich (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  6. Karlsruhe Institute of Technology, Institute for Photon Science and Synchrotron Radiation and ANKA Synchrotron Radiation Facility, Eggenstein-Leopoldshafen (Germany)
  7. European Synchrotron Radiation Facility, Grenoble (France)
  8. Univ. of Freiburg, Freiburg (Germany)
  9. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  10. Julich Center for Neutron Science (JCNS) and Peter Grunberg Institute PGI, Julich (Germany); Univ. of Liege, Liege (Belgium); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1247945
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Crystal Research and Technology
Additional Journal Information:
Journal Volume: 51; Journal Issue: 4; Journal ID: ISSN 0232-1300
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; x-ray optics; topography; sapphire; dislocations

Citation Formats

Asadchikov, Victor E., Butashin, Andrey V., Buzmakov, Alexey V., Deryabin, Alexander N., Kanevsky, Vladimir M., Prokhorov, Igor A., Roshchin, Boris S., Volkov, Yuri O., Zolotov, Dennis A., Jafari, Atefeh, Alexeev, Pavel, Cecilia, Angelica, Baumbach, Tilo, Bessas, Dimitrios, Danilewsky, Andreas N., Sergueev, Ilya, Wille, Hans -Christian, and Hermann, Raphael P. Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators. United States: N. p., 2016. Web. doi:10.1002/crat.201500343.
Asadchikov, Victor E., Butashin, Andrey V., Buzmakov, Alexey V., Deryabin, Alexander N., Kanevsky, Vladimir M., Prokhorov, Igor A., Roshchin, Boris S., Volkov, Yuri O., Zolotov, Dennis A., Jafari, Atefeh, Alexeev, Pavel, Cecilia, Angelica, Baumbach, Tilo, Bessas, Dimitrios, Danilewsky, Andreas N., Sergueev, Ilya, Wille, Hans -Christian, & Hermann, Raphael P. Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators. United States. doi:10.1002/crat.201500343.
Asadchikov, Victor E., Butashin, Andrey V., Buzmakov, Alexey V., Deryabin, Alexander N., Kanevsky, Vladimir M., Prokhorov, Igor A., Roshchin, Boris S., Volkov, Yuri O., Zolotov, Dennis A., Jafari, Atefeh, Alexeev, Pavel, Cecilia, Angelica, Baumbach, Tilo, Bessas, Dimitrios, Danilewsky, Andreas N., Sergueev, Ilya, Wille, Hans -Christian, and Hermann, Raphael P. Tue . "Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators". United States. doi:10.1002/crat.201500343. https://www.osti.gov/servlets/purl/1247945.
@article{osti_1247945,
title = {Single-crystal sapphire microstructure for high-resolution synchrotron X-ray monochromators},
author = {Asadchikov, Victor E. and Butashin, Andrey V. and Buzmakov, Alexey V. and Deryabin, Alexander N. and Kanevsky, Vladimir M. and Prokhorov, Igor A. and Roshchin, Boris S. and Volkov, Yuri O. and Zolotov, Dennis A. and Jafari, Atefeh and Alexeev, Pavel and Cecilia, Angelica and Baumbach, Tilo and Bessas, Dimitrios and Danilewsky, Andreas N. and Sergueev, Ilya and Wille, Hans -Christian and Hermann, Raphael P.},
abstractNote = {We report on the growth and characterization of several sapphire single crystals for the purpose of x-ray optics applications. Structural defects were studied by means of laboratory double-crystal X-ray diffractometry and white beam synchrotron-radiation topography. The investigations confirmed that the main defect types are dislocations. The best quality crystal was grown using the Kyropoulos technique with a dislocation density of 102-103 cm-2 and a small area with approximately 2*2 mm2 did not show dislocation contrast in many reflections and has suitable quality for application as a backscattering monochromator. As a result, a clear correlation between growth rate and dislocation density is observed, though growth rate is not the only parameter impacting the quality.},
doi = {10.1002/crat.201500343},
journal = {Crystal Research and Technology},
number = 4,
volume = 51,
place = {United States},
year = {2016},
month = {3}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 4 works
Citation information provided by
Web of Science

Figures / Tables:

Figure 1: Figure 1:: Laboratory setup for X-­ ray topography: F – X-­ray source, M – Ge monochromator crystal, S,S1,S2 – slits, C – sample, D – point detector. The double-­slit mode enables sample curvature measurements.

Save / Share:

Works referenced in this record:

Milli-electronvolt monochromatization of hard X-rays with a sapphire backscattering monochromator
journal, July 2011

  • Sergueev, I.; Wille, H. -C.; Hermann, R. P.
  • Journal of Synchrotron Radiation, Vol. 18, Issue 5
  • DOI: 10.1107/S090904951102485X

Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm 2
journal, April 2006

  • Sutter, John P.; Baron, Alfred Q. R.; Miwa, Daigo
  • Journal of Synchrotron Radiation, Vol. 13, Issue 3
  • DOI: 10.1107/S0909049506003888

Helical Dislocations
journal, September 1957


The micro-imaging station of the TopoTomo beamline at the ANKA synchrotron light source
journal, June 2009

  • Rack, A.; Weitkamp, T.; Bauer Trabelsi, S.
  • Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Vol. 267, Issue 11
  • DOI: 10.1016/j.nimb.2009.04.002

Thermal Stresses and Cracks During the Growth of Large-sized Sapphire with SAPMAC Method
journal, October 2007


Properties of an inclined double crystal monochromator for synchrotron radiation
journal, April 1993

  • Hrdý, J.; Pacherová, O.
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 327, Issue 2-3
  • DOI: 10.1016/0168-9002(93)90731-V

Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography
journal, May 2003


Fabrication of diffraction gratings for hard X-ray phase contrast imaging
journal, May 2007

  • David, C.; Bruder, J.; Rohbeck, T.
  • Microelectronic Engineering, Vol. 84, Issue 5-8, p. 1172-1177
  • DOI: 10.1016/j.mee.2007.01.151

Dislocation behaviour in sapphire single crystals
journal, October 1972


The study of basal dislocations in sapphire
journal, January 1972


X-ray Optics for Synchrotron Radiation; Perfect Crystals, Mirrors and Multilayers
journal, November 1998

  • Hart, M.; Berman, L.
  • Acta Crystallographica Section A Foundations of Crystallography, Vol. 54, Issue 6
  • DOI: 10.1107/S0108767398011283

Nuclear resonant scattering of synchrotron radiation from 161 Dy at 25.61 keV
journal, October 2001


129 Xe nuclear resonance scattering on solid Xe and 129 Xe clathrate hydrate
journal, August 2013


The observation of helical dislocations in sapphire
journal, August 1971

  • Caslavsky, J. L.; Gazzara, C. P.
  • Journal of Materials Science, Vol. 6, Issue 8
  • DOI: 10.1007/BF00980613

Preparation of Sapphire for High Quality III-Nitride Growth
journal, January 2000

  • Cui, J.; Sun, A.; Reshichkov, M.
  • MRS Internet Journal of Nitride Semiconductor Research, Vol. 5, Issue 1
  • DOI: 10.1557/S1092578300000077

Nondestructive methods of controlling the surface nanorelief by the example of sapphire substrates
journal, December 2009


An X-ray Focusing System Combining a Sagittally-bent Crystal and a Kirkpatrick-Baez System
conference, January 2004

  • Ziegler, E.
  • SYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentation, AIP Conference Proceedings
  • DOI: 10.1063/1.1757909

    Works referencing / citing this record:

    Rocking curve imaging of high quality sapphire crystals in backscattering geometry
    journal, January 2017

    • Jafari, A.; Sergueev, I.; Bessas, D.
    • Journal of Applied Physics, Vol. 121, Issue 4
    • DOI: 10.1063/1.4974106

    Rocking curve imaging of high quality sapphire crystals in backscattering geometry
    journal, January 2017

    • Jafari, A.; Sergueev, I.; Bessas, D.
    • Journal of Applied Physics, Vol. 121, Issue 4
    • DOI: 10.1063/1.4974106