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Title: The effect of humidity on reverse breakdown in 3D silicon sensors

Authors:
; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1247226
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment Journal Volume: 785 Journal Issue: C; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., and Parker, S. I.. The effect of humidity on reverse breakdown in 3D silicon sensors. Netherlands: N. p., 2015. Web. doi:10.1016/j.nima.2015.02.056.
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., & Parker, S. I.. The effect of humidity on reverse breakdown in 3D silicon sensors. Netherlands. doi:10.1016/j.nima.2015.02.056.
McDuff, H., Hoeferkamp, M. R., Seidel, S., Wang, R., Kenney, C. J., Hasi, J., and Parker, S. I.. Mon . "The effect of humidity on reverse breakdown in 3D silicon sensors". Netherlands. doi:10.1016/j.nima.2015.02.056.
@article{osti_1247226,
title = {The effect of humidity on reverse breakdown in 3D silicon sensors},
author = {McDuff, H. and Hoeferkamp, M. R. and Seidel, S. and Wang, R. and Kenney, C. J. and Hasi, J. and Parker, S. I.},
abstractNote = {},
doi = {10.1016/j.nima.2015.02.056},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = C,
volume = 785,
place = {Netherlands},
year = {2015},
month = {6}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.nima.2015.02.056

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Cited by: 1 work
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