Quantitative modeling of electron spectroscopy intensities for supported nanoparticles: The hemispherical cap model for non-normal detection
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1244728
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Surface Science
- Additional Journal Information:
- Journal Name: Surface Science Journal Volume: 632 Journal Issue: C; Journal ID: ISSN 0039-6028
- Publisher:
- Elsevier
- Country of Publication:
- Netherlands
- Language:
- English
Citation Formats
Sharp, James C., and Campbell, Charles T. Quantitative modeling of electron spectroscopy intensities for supported nanoparticles: The hemispherical cap model for non-normal detection. Netherlands: N. p., 2015.
Web. doi:10.1016/j.susc.2014.08.010.
Sharp, James C., & Campbell, Charles T. Quantitative modeling of electron spectroscopy intensities for supported nanoparticles: The hemispherical cap model for non-normal detection. Netherlands. https://doi.org/10.1016/j.susc.2014.08.010
Sharp, James C., and Campbell, Charles T. Sun .
"Quantitative modeling of electron spectroscopy intensities for supported nanoparticles: The hemispherical cap model for non-normal detection". Netherlands. https://doi.org/10.1016/j.susc.2014.08.010.
@article{osti_1244728,
title = {Quantitative modeling of electron spectroscopy intensities for supported nanoparticles: The hemispherical cap model for non-normal detection},
author = {Sharp, James C. and Campbell, Charles T.},
abstractNote = {},
doi = {10.1016/j.susc.2014.08.010},
journal = {Surface Science},
number = C,
volume = 632,
place = {Netherlands},
year = {Sun Feb 01 00:00:00 EST 2015},
month = {Sun Feb 01 00:00:00 EST 2015}
}
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https://doi.org/10.1016/j.susc.2014.08.010
https://doi.org/10.1016/j.susc.2014.08.010
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