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Title: Thickness-dependent charge transport in few-layer MoS 2 field-effect transistors

Authors:
; ; ; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1241432
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Nanotechnology
Additional Journal Information:
Journal Name: Nanotechnology Journal Volume: 27 Journal Issue: 16; Journal ID: ISSN 0957-4484
Publisher:
IOP Publishing
Country of Publication:
United Kingdom
Language:
English

Citation Formats

Lin, Ming-Wei, Kravchenko, Ivan I., Fowlkes, Jason, Li, Xufan, Puretzky, Alexander A., Rouleau, Christopher M., Geohegan, David B., and Xiao, Kai. Thickness-dependent charge transport in few-layer MoS 2 field-effect transistors. United Kingdom: N. p., 2016. Web. doi:10.1088/0957-4484/27/16/165203.
Lin, Ming-Wei, Kravchenko, Ivan I., Fowlkes, Jason, Li, Xufan, Puretzky, Alexander A., Rouleau, Christopher M., Geohegan, David B., & Xiao, Kai. Thickness-dependent charge transport in few-layer MoS 2 field-effect transistors. United Kingdom. https://doi.org/10.1088/0957-4484/27/16/165203
Lin, Ming-Wei, Kravchenko, Ivan I., Fowlkes, Jason, Li, Xufan, Puretzky, Alexander A., Rouleau, Christopher M., Geohegan, David B., and Xiao, Kai. Thu . "Thickness-dependent charge transport in few-layer MoS 2 field-effect transistors". United Kingdom. https://doi.org/10.1088/0957-4484/27/16/165203.
@article{osti_1241432,
title = {Thickness-dependent charge transport in few-layer MoS 2 field-effect transistors},
author = {Lin, Ming-Wei and Kravchenko, Ivan I. and Fowlkes, Jason and Li, Xufan and Puretzky, Alexander A. and Rouleau, Christopher M. and Geohegan, David B. and Xiao, Kai},
abstractNote = {},
doi = {10.1088/0957-4484/27/16/165203},
journal = {Nanotechnology},
number = 16,
volume = 27,
place = {United Kingdom},
year = {Thu Mar 10 00:00:00 EST 2016},
month = {Thu Mar 10 00:00:00 EST 2016}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1088/0957-4484/27/16/165203

Citation Metrics:
Cited by: 116 works
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