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Title: In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation

Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [1] ;  [4] ;  [4] ;  [5] ; ORCiD logo [4]
  1. School of Engineering, Brown University, Providence, Rhode Island 02912, USA
  2. IBM, Hopewell Junction, New York 12533, USA
  3. Saint-Gobain, Northboro R&D Center, Northborough, Massachusetts 01532, USA
  4. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
  5. Oak Ridge National Lab, Oak Ridge, Tennessee 37831, USA
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 119 Journal Issue: 10; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1241406

Pei, Fei, Jadhav, Nitin, Buchovecky, Eric, Bower, Allan F., Chason, Eric, Liu, Wenjun, Tischler, Jonathan Z., Ice, Gene E., and Xu, Ruqing. In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation. United States: N. p., Web. doi:10.1063/1.4942920.
Pei, Fei, Jadhav, Nitin, Buchovecky, Eric, Bower, Allan F., Chason, Eric, Liu, Wenjun, Tischler, Jonathan Z., Ice, Gene E., & Xu, Ruqing. In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation. United States. doi:10.1063/1.4942920.
Pei, Fei, Jadhav, Nitin, Buchovecky, Eric, Bower, Allan F., Chason, Eric, Liu, Wenjun, Tischler, Jonathan Z., Ice, Gene E., and Xu, Ruqing. 2016. "In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation". United States. doi:10.1063/1.4942920.
@article{osti_1241406,
title = {In-situ synchrotron micro-diffraction study of surface, interface, grain structure, and strain/stress evolution during Sn whisker/hillock formation},
author = {Pei, Fei and Jadhav, Nitin and Buchovecky, Eric and Bower, Allan F. and Chason, Eric and Liu, Wenjun and Tischler, Jonathan Z. and Ice, Gene E. and Xu, Ruqing},
abstractNote = {},
doi = {10.1063/1.4942920},
journal = {Journal of Applied Physics},
number = 10,
volume = 119,
place = {United States},
year = {2016},
month = {3}
}

Works referenced in this record:

Whisker and Hillock formation on Sn, Sn–Cu and Sn–Pb electrodeposits
journal, November 2005

Three-dimensional X-ray structural microscopy with submicrometre resolution
journal, February 2002
  • Larson, B. C.; Yang, Wenge; Ice, G. E.
  • Nature, Vol. 415, p. 887-890
  • DOI: 10.1038/415887a