skip to main content

DOE PAGESDOE PAGES

Title: Zeroth order Fabry-Perot resonance enabled ultra-thin perfect light absorber using percolation aluminum and silicon nanofilms

Here, we demonstrated perfect light absorption in optical nanocavities made of ultra-thin percolation aluminum and silicon films deposited on an aluminum surface. The total layer thickness of the aluminum and silicon films is one order of magnitude less than perfect absorption wavelength in the visible spectral range. The ratio of silicon cavity layer thickness to perfect absorption wavelength decreases as wavelength decreases due to the increased phase delays at silicon-aluminum boundaries at shorter wavelengths. It is explained that perfect light absorption is due to critical coupling of incident wave to the fundamental Fabry-Perot resonance mode of the structure where the round trip phase delay is zero. Simulations were performed and the results agree well with the measurement results.
Authors:
 [1] ;  [2] ;  [1]
  1. Univ. of Alabama in Huntsville, Huntsville, AL (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Grant/Contract Number:
2014-67022-21618; AC04-94AL85000
Type:
Published Article
Journal Name:
Optical Materials Express
Additional Journal Information:
Journal Volume: 6; Journal Issue: 4; Journal ID: ISSN 2159-3930
Publisher:
Optical Society of America (OSA)
Research Org:
Sandia National Lab. (SNL-CA), Livermore, CA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; thin films; metallic, opaque and absorbing coatings; nanomaterials
OSTI Identifier:
1240303
Alternate Identifier(s):
OSTI ID: 1266784