Thickness-dependent electron–lattice equilibration in laser-excited thin bismuth films

Sokolowski-Tinten, K.; Li, R. K.; Reid, A. H.; Weathersby, S. P.; Quirin, F.; Chase, T.; Coffee, R.; Corbett, J.; Fry, A.; Hartmann, N.; Hast, C.; Hettel, R.; Hoegen, M. Horn von; Janoschka, D.; Lewandowski, J. R.; Ligges, M.; Heringdorf, F. Meyer zu; Shen, X.; Vecchione, T.; Witt, C.; Wu, J.; Dürr, H. A.; Wang, X. J.

doi:10.1088/1367-2630/17/11/113047

Title: Thickness-dependent electron–lattice equilibration in laser-excited thin bismuth films

Journal Article · 31 October 2015 · New Journal of Physics

DOI: https://doi.org/10.1088/1367-2630/17/11/113047 · OSTI ID:1238985

Sokolowski-Tinten, K.; Li, R. K.; Reid, A. H.; Weathersby, S. P.; Quirin, F.; Chase, T.; Coffee, R.; Corbett, J.; Fry, A.; Hartmann, N.; Hast, C.; Hettel, R.; Hoegen, M. Horn von; Janoschka, D.; Lewandowski, J. R.; Ligges, M.; Heringdorf, F. Meyer zu; Shen, X.; Vecchione, T.; Witt, C. more »

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1238985

Journal Information:: New Journal of Physics, Journal Name: New Journal of Physics Journal Issue: 11 Vol. 17; ISSN 1367-2630

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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