Prance, J. R., Bael, B. J. Van, Simmons, C. B., Savage, D. E., Lagally, M. G., Friesen, Mark, Coppersmith, S. N., and Eriksson, M. A.. Identifying single electron charge sensor events using wavelet edge detection. United Kingdom: N. p.,
Web. doi:10.1088/0957-4484/26/21/215201.
Prance, J. R., Bael, B. J. Van, Simmons, C. B., Savage, D. E., Lagally, M. G., Friesen, Mark, Coppersmith, S. N., & Eriksson, M. A.. Identifying single electron charge sensor events using wavelet edge detection. United Kingdom. doi:10.1088/0957-4484/26/21/215201.
Prance, J. R., Bael, B. J. Van, Simmons, C. B., Savage, D. E., Lagally, M. G., Friesen, Mark, Coppersmith, S. N., and Eriksson, M. A.. 2015.
"Identifying single electron charge sensor events using wavelet edge detection". United Kingdom.
doi:10.1088/0957-4484/26/21/215201.
@article{osti_1238968,
title = {Identifying single electron charge sensor events using wavelet edge detection},
author = {Prance, J. R. and Bael, B. J. Van and Simmons, C. B. and Savage, D. E. and Lagally, M. G. and Friesen, Mark and Coppersmith, S. N. and Eriksson, M. A.},
abstractNote = {},
doi = {10.1088/0957-4484/26/21/215201},
journal = {Nanotechnology},
number = 21,
volume = 26,
place = {United Kingdom},
year = {2015},
month = {5}
}
