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Title: An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics

Abstract

X-ray phase-contrast techniques can measure electron density gradients in high-energy-density plasmas through refraction induced phase shifts. An 8 keV Talbot-Lau interferometer consisting of free standing ultrathin gratings was deployed at an ultra-short, high-intensity laser system using K-shell emission from a 1-30 J, 8 ps laser pulse focused on thin Cu foil targets. Grating survival was demonstrated for 30 J, 8 ps laser pulses. The first x-ray deflectometry images obtained under laser backlighting showed up to 25% image contrast and thus enabled detection of electron areal density gradients with a maximum value of 8.1 ± 0.5 × 1023 cm₋3 in a low-Z millimeter sized sample. An electron density profile was obtained from refraction measurements with an error of <8%. We found the 50 ± 15 μm spatial resolution achieved across the full field of view was limited by the x-ray source-size, similar to conventional radiography.

Authors:
 [1];  [1];  [2];  [2];  [2];  [2];  [2];  [2]
+ Show Author Affiliations
  1. Johns Hopkins Univ., Baltimore, MD (United States). Department of Physics and Astronomy
  2. Univ. of Rochester, NY (United States). Lab. for Laser Energetics
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Physics and Astronomy
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1258591
Alternate Identifier(s):
OSTI ID: 1237775
Grant/Contract Number:  
NA0001835; DENA0001835
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS

Citation Formats

Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Mileham, C., Begishev, I. A., Bromage, J., and Regan, S. P. An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics. United States: N. p., 2016. Web. doi:10.1063/1.4941441.
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Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Mileham, C., Begishev, I. A., Bromage, J., & Regan, S. P. An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics. United States. https://doi.org/10.1063/1.4941441
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Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Mileham, C., Begishev, I. A., Bromage, J., and Regan, S. P. Wed . "An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics". United States. https://doi.org/10.1063/1.4941441. https://www.osti.gov/servlets/purl/1258591.
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@article{osti_1258591,
title = {An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics},
author = {Valdivia, M. P. and Stutman, D. and Stoeckl, C. and Theobald, W. and Mileham, C. and Begishev, I. A. and Bromage, J. and Regan, S. P.},
abstractNote = {X-ray phase-contrast techniques can measure electron density gradients in high-energy-density plasmas through refraction induced phase shifts. An 8 keV Talbot-Lau interferometer consisting of free standing ultrathin gratings was deployed at an ultra-short, high-intensity laser system using K-shell emission from a 1-30 J, 8 ps laser pulse focused on thin Cu foil targets. Grating survival was demonstrated for 30 J, 8 ps laser pulses. The first x-ray deflectometry images obtained under laser backlighting showed up to 25% image contrast and thus enabled detection of electron areal density gradients with a maximum value of 8.1 ± 0.5 × 1023 cm₋3 in a low-Z millimeter sized sample. An electron density profile was obtained from refraction measurements with an error of <8%. We found the 50 ± 15 μm spatial resolution achieved across the full field of view was limited by the x-ray source-size, similar to conventional radiography.},
doi = {10.1063/1.4941441},
journal = {Review of Scientific Instruments},
number = 2,
volume = 87,
place = {United States},
year = {Wed Feb 10 00:00:00 EST 2016},
month = {Wed Feb 10 00:00:00 EST 2016}
}
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Publisher's Version of Record
https://doi.org/10.1063/1.4941441
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    Works referencing / citing this record:

    X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry
    journal, October 2018

    • Valdivia, M. P.; Veloso, F.; Stutman, D.
    • Review of Scientific Instruments, Vol. 89, Issue 10
    • DOI: 10.1063/1.5039342

    Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments
    journal, January 2018

    • Valdivia, Maria Pia; Stutman, Dan; Stoeckl, Christian
    • Applied Optics, Vol. 57, Issue 2
    • DOI: 10.1364/ao.57.000138

    Advanced high resolution x-ray diagnostic for HEDP experiments
    journal, November 2018

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