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Title: Thickness-dependent electronic structure in ultrathin LaNiO 3 films under tensile strain

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 93; Journal Issue: 3; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1236511

Yoo, Hyang Keun, Hyun, Seung Ill, Chang, Young Jun, Moreschini, Luca, Sohn, Chang Hee, Kim, Hyeong-Do, Bostwick, Aaron, Rotenberg, Eli, Shim, Ji Hoon, and Noh, Tae Won. Thickness-dependent electronic structure in ultrathin LaNiO 3 films under tensile strain. United States: N. p., Web. doi:10.1103/PhysRevB.93.035141.
Yoo, Hyang Keun, Hyun, Seung Ill, Chang, Young Jun, Moreschini, Luca, Sohn, Chang Hee, Kim, Hyeong-Do, Bostwick, Aaron, Rotenberg, Eli, Shim, Ji Hoon, & Noh, Tae Won. Thickness-dependent electronic structure in ultrathin LaNiO 3 films under tensile strain. United States. doi:10.1103/PhysRevB.93.035141.
Yoo, Hyang Keun, Hyun, Seung Ill, Chang, Young Jun, Moreschini, Luca, Sohn, Chang Hee, Kim, Hyeong-Do, Bostwick, Aaron, Rotenberg, Eli, Shim, Ji Hoon, and Noh, Tae Won. 2016. "Thickness-dependent electronic structure in ultrathin LaNiO 3 films under tensile strain". United States. doi:10.1103/PhysRevB.93.035141.
@article{osti_1236511,
title = {Thickness-dependent electronic structure in ultrathin LaNiO 3 films under tensile strain},
author = {Yoo, Hyang Keun and Hyun, Seung Ill and Chang, Young Jun and Moreschini, Luca and Sohn, Chang Hee and Kim, Hyeong-Do and Bostwick, Aaron and Rotenberg, Eli and Shim, Ji Hoon and Noh, Tae Won},
abstractNote = {},
doi = {10.1103/PhysRevB.93.035141},
journal = {Physical Review B},
number = 3,
volume = 93,
place = {United States},
year = {2016},
month = {1}
}