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Title: Thermal conductivity in nanocrystalline-SiC/C superlattices

Abstract

We reported the formation of thin film superlattices consisting of alternating layers of nitrogen-doped SiC (SiC:N) and C. Periodically terminating the SiC:N surface with a graphitic C boundary layer and controlling the SiC:N/C thickness ratio yield nanocrystalline SiC grains ranging in size from 365 to 23 nm. Frequency domain thermo-reflectance is employed to determine the thermal conductivity, which is found to vary from 35.5 W m -1 K -1 for monolithic undoped α-SiC films to 1.6 W m -1 K -1 for a SiC:N/C superlattice with a 47 nm period and a SiC:N/C thickness ratio of 11. A series conductance model is employed to explain the dependence of the thermal conductivity on the superlatticestructure. Our results indicate that the thermal conductivity is more dependent on the SiC:N/C thickness ratio than the SiC:N grain size, indicative of strong boundary layerphonon scattering.

Authors:
 [1];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1236207
Report Number(s):
SAND-2015-7224J
Journal ID: ISSN 0003-6951; APPLAB; 604114
Grant/Contract Number:  
AC04-94AL85000
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 107; Journal Issue: 20; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; superlattices; phonons; thermal conductivity; sputter deposition; boundary layer control

Citation Formats

Habermehl, S., and Serrano, J. R. Thermal conductivity in nanocrystalline-SiC/C superlattices. United States: N. p., 2015. Web. doi:10.1063/1.4936094.
Habermehl, S., & Serrano, J. R. Thermal conductivity in nanocrystalline-SiC/C superlattices. United States. doi:10.1063/1.4936094.
Habermehl, S., and Serrano, J. R. Tue . "Thermal conductivity in nanocrystalline-SiC/C superlattices". United States. doi:10.1063/1.4936094. https://www.osti.gov/servlets/purl/1236207.
@article{osti_1236207,
title = {Thermal conductivity in nanocrystalline-SiC/C superlattices},
author = {Habermehl, S. and Serrano, J. R.},
abstractNote = {We reported the formation of thin film superlattices consisting of alternating layers of nitrogen-doped SiC (SiC:N) and C. Periodically terminating the SiC:N surface with a graphitic C boundary layer and controlling the SiC:N/C thickness ratio yield nanocrystalline SiC grains ranging in size from 365 to 23 nm. Frequency domain thermo-reflectance is employed to determine the thermal conductivity, which is found to vary from 35.5 W m-1 K-1 for monolithic undoped α-SiC films to 1.6 W m-1 K-1 for a SiC:N/C superlattice with a 47 nm period and a SiC:N/C thickness ratio of 11. A series conductance model is employed to explain the dependence of the thermal conductivity on the superlatticestructure. Our results indicate that the thermal conductivity is more dependent on the SiC:N/C thickness ratio than the SiC:N grain size, indicative of strong boundary layerphonon scattering.},
doi = {10.1063/1.4936094},
journal = {Applied Physics Letters},
number = 20,
volume = 107,
place = {United States},
year = {2015},
month = {11}
}

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