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Title: Identifying different stacking sequences in few-layer CVD-grown Mo S 2 by low-energy atomic-resolution scanning transmission electron microscopy

Authors:
; ; ; ; ; ;
Publication Date:
Grant/Contract Number:
AC02-05CH11231; EDCBEE
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Name: Physical Review B Journal Volume: 93 Journal Issue: 4; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1235955

Yan, Aiming, Chen, Wei, Ophus, Colin, Ciston, Jim, Lin, Yuyuan, Persson, Kristin, and Zettl, Alex. Identifying different stacking sequences in few-layer CVD-grown Mo S 2 by low-energy atomic-resolution scanning transmission electron microscopy. United States: N. p., Web. doi:10.1103/PhysRevB.93.041420.
Yan, Aiming, Chen, Wei, Ophus, Colin, Ciston, Jim, Lin, Yuyuan, Persson, Kristin, & Zettl, Alex. Identifying different stacking sequences in few-layer CVD-grown Mo S 2 by low-energy atomic-resolution scanning transmission electron microscopy. United States. doi:10.1103/PhysRevB.93.041420.
Yan, Aiming, Chen, Wei, Ophus, Colin, Ciston, Jim, Lin, Yuyuan, Persson, Kristin, and Zettl, Alex. 2016. "Identifying different stacking sequences in few-layer CVD-grown Mo S 2 by low-energy atomic-resolution scanning transmission electron microscopy". United States. doi:10.1103/PhysRevB.93.041420.
@article{osti_1235955,
title = {Identifying different stacking sequences in few-layer CVD-grown Mo S 2 by low-energy atomic-resolution scanning transmission electron microscopy},
author = {Yan, Aiming and Chen, Wei and Ophus, Colin and Ciston, Jim and Lin, Yuyuan and Persson, Kristin and Zettl, Alex},
abstractNote = {},
doi = {10.1103/PhysRevB.93.041420},
journal = {Physical Review B},
number = 4,
volume = 93,
place = {United States},
year = {2016},
month = {1}
}