Full information acquisition in piezoresponse force microscopy
Abstract
The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.
- Authors:
-
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1235834
- Alternate Identifier(s):
- OSTI ID: 1234028
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 107; Journal Issue: 26; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 77 NANOSCIENCE AND NANOTECHNOLOGY; piezoresponse force microscopy; scanning probe microscopy; big data; principal component analysis; atomic force microscopy; eigenvalues; normal modes; multivariate analysis
Citation Formats
Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, and Kalinin, Sergei V. Full information acquisition in piezoresponse force microscopy. United States: N. p., 2015.
Web. doi:10.1063/1.4938482.
Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, & Kalinin, Sergei V. Full information acquisition in piezoresponse force microscopy. United States. https://doi.org/10.1063/1.4938482
Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, and Kalinin, Sergei V. Mon .
"Full information acquisition in piezoresponse force microscopy". United States. https://doi.org/10.1063/1.4938482. https://www.osti.gov/servlets/purl/1235834.
@article{osti_1235834,
title = {Full information acquisition in piezoresponse force microscopy},
author = {Somnath, Suhas and Belianinov, Alex and Jesse, Stephen and Kalinin, Sergei V.},
abstractNote = {The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.},
doi = {10.1063/1.4938482},
journal = {Applied Physics Letters},
number = 26,
volume = 107,
place = {United States},
year = {2015},
month = {12}
}
Web of Science
Works referenced in this record:
Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
journal, February 2005
- Dehoff, C.; Rodriguez, B. J.; Kingon, A. I.
- Review of Scientific Instruments, Vol. 76, Issue 2
Molecular ferroelectrics: where electronics meet biology
journal, January 2013
- Li, Jiangyu; Liu, Yuanming; Zhang, Yanhang
- Physical Chemistry Chemical Physics, Vol. 15, Issue 48
Multivariate statistical methods for the analysis of microscope image series: applications in materials science
journal, April 1998
- Bonnet, N.
- Journal of Microscopy, Vol. 190, Issue 1‐2
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
journal, September 2007
- Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger
- Nanotechnology, Vol. 18, Issue 43
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy
journal, February 2009
- Jesse, Stephen; Kalinin, Sergei V.
- Nanotechnology, Vol. 20, Issue 8
Band excitation in scanning probe microscopy: sines of change
journal, November 2011
- Jesse, Stephen; Kalinin, Sergei V.
- Journal of Physics D: Applied Physics, Vol. 44, Issue 46
Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy
journal, August 2007
- Kalinin, Sergei V.; Rodriguez, Brian J.; Jesse, Stephen
- Annual Review of Materials Research, Vol. 37, Issue 1
Contact resonances in voltage-modulated force microscopy
journal, July 2003
- Harnagea, C.; Alexe, M.; Hesse, D.
- Applied Physics Letters, Vol. 83, Issue 2
Dual-frequency resonance-tracking atomic force microscopy
journal, October 2007
- Rodriguez, Brian J.; Callahan, Clint; Kalinin, Sergei V.
- Nanotechnology, Vol. 18, Issue 47, Article No. 475504
Complete information acquisition in dynamic force microscopy
journal, March 2015
- Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen
- Nature Communications, Vol. 6, Issue 1
Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006
- Bosman, M.; Watanabe, M.; Alexander, D. T. L.
- Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032
A decade of piezoresponse force microscopy: progress, challenges, and opportunities
journal, December 2006
- Kalinin, Sergei; Rar, Andrei; Jesse, Stephen
- IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Vol. 53, Issue 12
Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy
journal, September 2010
- Jesse, S.; Guo, S.; Kumar, A.
- Nanotechnology, Vol. 21, Issue 40
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale
journal, September 2009
- Bonnell, D. A.; Kalinin, S. V.; Kholkin, A. L.
- MRS Bulletin, Vol. 34, Issue 9
Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future
journal, August 2009
- Balke, Nina; Bdikin, Igor; Kalinin, Sergei V.
- Journal of the American Ceramic Society, Vol. 92, Issue 8
Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution
journal, September 2010
- Balke, Nina; Jesse, Stephen; Kim, Yoongu
- Nano Letters, Vol. 10, Issue 9
Direct Mapping of Ionic Transport in a Si Anode on the Nanoscale: Time Domain Electrochemical Strain Spectroscopy Study
journal, November 2011
- Jesse, Stephen; Balke, Nina; Eliseev, Eugene
- ACS Nano, Vol. 5, Issue 12
Scanning Force Microscopy Studies of Domain Structure in B a T i O 3 Single Crystals
journal, April 1997
- Gruverman, Alexei L.; Hatano, Jun; Tokumoto, Hiroshi
- Japanese Journal of Applied Physics, Vol. 36, Issue Part 1, No. 4A
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy
journal, August 1998
- Gruverman, Alexei; Auciello, Orlando; Tokumoto, Hiroshi
- Annual Review of Materials Science, Vol. 28, Issue 1
Electromechanics on the Nanometer Scale: Emerging Phenomena, Devices, and Applications
journal, September 2009
- Kalinin, Sergei V.; Setter, Nava; Kholkin, Andrei L.
- MRS Bulletin, Vol. 34, Issue 9
High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging
journal, August 2008
- Nath, Ramesh; Chu, Ying-Hao; Polomoff, Nicholas A.
- Applied Physics Letters, Vol. 93, Issue 7, Article No. 072905
Ferroelectric domain switching dynamics with combined 20 nm and 10 ns resolution
journal, October 2009
- Polomoff, Nicholas A.; Premnath, Ramesh Nath; Bosse, James L.
- Journal of Materials Science, Vol. 44, Issue 19
Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control
journal, September 1997
- Gruverman, A.; Auciello, O.; Ramesh, R.
- Nanotechnology, Vol. 8, Issue 3A
Electromechanical probing of ionic currents in energy storage materials
journal, May 2010
- Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V.
- Applied Physics Letters, Vol. 96, Issue 22
Role of 90° domains in lead zirconate titanate thin films
journal, July 2000
- Ganpule, C. S.; Nagarajan, V.; Li, H.
- Applied Physics Letters, Vol. 77, Issue 2
Electromechanical Probing of Ionic Currents in Energy Storage Materials
text, January 2010
- Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V.
- arXiv
A Decade of Piezoresponse Force Microscopy: Progress, Challenges and Opportunities
text, January 2005
- Kalinin, Sergei V.; Rar, Andrei; Jesse, Stephen
- arXiv
Works referencing / citing this record:
Revealing ferroelectric switching character using deep recurrent neural networks
journal, October 2019
- Agar, Joshua C.; Naul, Brett; Pandya, Shishir
- Nature Communications, Vol. 10, Issue 1
Deep neural networks for understanding noisy data applied to physical property extraction in scanning probe microscopy
journal, February 2019
- Borodinov, Nikolay; Neumayer, Sabine; Kalinin, Sergei V.
- npj Computational Materials, Vol. 5, Issue 1
Application of pan-sharpening algorithm for correlative multimodal imaging using AFM-IR
journal, April 2019
- Borodinov, Nikolay; Bilkey, Natasha; Foston, Marcus
- npj Computational Materials, Vol. 5, Issue 1
Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
journal, May 2016
- Jesse, S.; Chi, M.; Belianinov, A.
- Scientific Reports, Vol. 6, Issue 1
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space
journal, August 2016
- Collins, Liam; Belianinov, Alex; Somnath, Suhas
- Scientific Reports, Vol. 6, Issue 1
Molecular reorganization in bulk bottlebrush polymers: direct observation via nanoscale imaging
journal, January 2018
- Borodinov, Nikolay; Belianinov, Alex; Chang, Dongsook
- Nanoscale, Vol. 10, Issue 37
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics
journal, May 2016
- Collins, Liam; Belianinov, Alex; Proksch, Roger
- Applied Physics Letters, Vol. 108, Issue 19
Tutorial: Product properties in multiferroic nanocomposites
journal, August 2018
- Viehland, Dwight; Li, Jie Fang; Yang, Yaodong
- Journal of Applied Physics, Vol. 124, Issue 6
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review
journal, July 2018
- Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V.
- Reports on Progress in Physics, Vol. 81, Issue 8
Frontiers in strain-engineered multifunctional ferroic materials
journal, August 2016
- Agar, Joshua C.; Pandya, Shishir; Xu, Ruijuan
- MRS Communications, Vol. 6, Issue 3
Materials science in the artificial intelligence age: high-throughput library generation, machine learning, and a pathway from correlations to the underpinning physics
journal, July 2019
- Vasudevan, Rama K.; Choudhary, Kamal; Mehta, Apurva
- MRS Communications, Vol. 9, Issue 3