skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Full information acquisition in piezoresponse force microscopy

Abstract

The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.

Authors:
 [1];  [1];  [1];  [1]
+ Show Author Affiliations
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1235834
Alternate Identifier(s):
OSTI ID: 1234028
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 107; Journal Issue: 26; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY; piezoresponse force microscopy; scanning probe microscopy; big data; principal component analysis; atomic force microscopy; eigenvalues; normal modes; multivariate analysis

Citation Formats

Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, and Kalinin, Sergei V. Full information acquisition in piezoresponse force microscopy. United States: N. p., 2015. Web. doi:10.1063/1.4938482.
Copy to clipboard
Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, & Kalinin, Sergei V. Full information acquisition in piezoresponse force microscopy. United States. doi:10.1063/1.4938482.
Copy to clipboard
Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, and Kalinin, Sergei V. Mon . "Full information acquisition in piezoresponse force microscopy". United States. doi:10.1063/1.4938482. https://www.osti.gov/servlets/purl/1235834.
Copy to clipboard
@article{osti_1235834,
title = {Full information acquisition in piezoresponse force microscopy},
author = {Somnath, Suhas and Belianinov, Alex and Jesse, Stephen and Kalinin, Sergei V.},
abstractNote = {The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.},
doi = {10.1063/1.4938482},
journal = {Applied Physics Letters},
number = 26,
volume = 107,
place = {United States},
year = {2015},
month = {12}
}
Copy to clipboard
Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI:  10.1063/1.4938482
Copyright Statement
Other availability
Search WorldCat Search WorldCat to find libraries that may hold this journal
Citation Metrics:
Cited by: 9 works
Citation information provided by
Web of Science
Save / Share:
Export Metadata
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.

Works referenced in this record:

Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
journal, February 2005

  • Dehoff, C.; Rodriguez, B. J.; Kingon, A. I.
  • Review of Scientific Instruments, Vol. 76, Issue 2
  • DOI: 10.1063/1.1850652

Molecular ferroelectrics: where electronics meet biology
journal, January 2013

  • Li, Jiangyu; Liu, Yuanming; Zhang, Yanhang
  • Physical Chemistry Chemical Physics, Vol. 15, Issue 48
  • DOI: 10.1039/c3cp52501e

The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
journal, September 2007

Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy
journal, February 2009

Band excitation in scanning probe microscopy: sines of change
journal, November 2011

Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy
journal, August 2007

Contact resonances in voltage-modulated force microscopy
journal, July 2003

  • Harnagea, C.; Alexe, M.; Hesse, D.
  • Applied Physics Letters, Vol. 83, Issue 2
  • DOI: 10.1063/1.1592307

Dual-frequency resonance-tracking atomic force microscopy
journal, October 2007

Complete information acquisition in dynamic force microscopy
journal, March 2015

  • Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen
  • Nature Communications, Vol. 6, Issue 1
  • DOI: 10.1038/ncomms7550

Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006

A decade of piezoresponse force microscopy: progress, challenges, and opportunities
journal, December 2006

  • Kalinin, Sergei; Rar, Andrei; Jesse, Stephen
  • IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, Vol. 53, Issue 12
  • DOI: 10.1109/TUFFC.2006.169

Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy
journal, September 2010

Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale
journal, September 2009

  • Bonnell, D. A.; Kalinin, S. V.; Kholkin, A. L.
  • MRS Bulletin, Vol. 34, Issue 9
  • DOI: 10.1557/mrs2009.176

Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future
journal, August 2009

Real Space Mapping of Li-Ion Transport in Amorphous Si Anodes with Nanometer Resolution
journal, September 2010

  • Balke, Nina; Jesse, Stephen; Kim, Yoongu
  • Nano Letters, Vol. 10, Issue 9
  • DOI: 10.1021/nl101439x

Direct Mapping of Ionic Transport in a Si Anode on the Nanoscale: Time Domain Electrochemical Strain Spectroscopy Study
journal, November 2011

  • Jesse, Stephen; Balke, Nina; Eliseev, Eugene
  • ACS Nano, Vol. 5, Issue 12
  • DOI: 10.1021/nn203141g

Scanning Force Microscopy Studies of Domain Structure in B a T i O 3 Single Crystals
journal, April 1997

  • Gruverman, Alexei L.; Hatano, Jun; Tokumoto, Hiroshi
  • Japanese Journal of Applied Physics, Vol. 36, Issue Part 1, No. 4A
  • DOI: 10.1143/JJAP.36.2207

Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy
journal, August 1998

Electromechanics on the Nanometer Scale: Emerging Phenomena, Devices, and Applications
journal, September 2009

  • Kalinin, Sergei V.; Setter, Nava; Kholkin, Andrei L.
  • MRS Bulletin, Vol. 34, Issue 9
  • DOI: 10.1557/mrs2009.174

High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging
journal, August 2008

  • Nath, Ramesh; Chu, Ying-Hao; Polomoff, Nicholas A.
  • Applied Physics Letters, Vol. 93, Issue 7, Article No. 072905
  • DOI: 10.1063/1.2969045

Ferroelectric domain switching dynamics with combined 20 nm and 10 ns resolution
journal, October 2009

  • Polomoff, Nicholas A.; Premnath, Ramesh Nath; Bosse, James L.
  • Journal of Materials Science, Vol. 44, Issue 19
  • DOI: 10.1007/s10853-009-3699-x

Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control
journal, September 1997

Electromechanical probing of ionic currents in energy storage materials
journal, May 2010

  • Morozovska, A. N.; Eliseev, E. A.; Kalinin, S. V.
  • Applied Physics Letters, Vol. 96, Issue 22
  • DOI: 10.1063/1.3446838

Role of 90° domains in lead zirconate titanate thin films
journal, July 2000

  • Ganpule, C. S.; Nagarajan, V.; Li, H.
  • Applied Physics Letters, Vol. 77, Issue 2
  • DOI: 10.1063/1.126954
    [ × clear filter / sort ]

    Works referencing / citing this record:

    Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
    journal, May 2016

    • Jesse, S.; Chi, M.; Belianinov, A.
    • Scientific Reports, Vol. 6, Issue 1
    • DOI: 10.1038/srep26348

    Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
    journal, May 2016

    • Jesse, S.; Chi, M.; Belianinov, A.
    • Scientific Reports, Vol. 6, Issue 1
    • DOI: 10.1038/srep26348
      [ × clear filter / sort ]

      Similar Records in DOE PAGES and OSTI.GOV collections: