Full information acquisition in piezoresponse force microscopy

doi:10.1063/1.4938482

Title: Full information acquisition in piezoresponse force microscopy

Abstract

The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.

Authors:

Somnath, Suhas ^[1]; Belianinov, Alex ^[1]; Jesse, Stephen ^[1]; Kalinin, Sergei V. ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Publication Date:: 2015-12-28

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1235834

Alternate Identifier(s):: OSTI ID: 1234028

Grant/Contract Number:: AC05-00OR22725

Resource Type:: Accepted Manuscript

Journal Name:: Applied Physics Letters

Additional Journal Information:: Journal Volume: 107; Journal Issue: 26; Journal ID: ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 77 NANOSCIENCE AND NANOTECHNOLOGY; piezoresponse force microscopy; scanning probe microscopy; big data; principal component analysis; atomic force microscopy; eigenvalues; normal modes; multivariate analysis

Citation Formats


                    Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, and Kalinin, Sergei V. Full information acquisition in piezoresponse force microscopy.  United States: N. p., 2015. 
        Web.  doi:10.1063/1.4938482.

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                    Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, & Kalinin, Sergei V. Full information acquisition in piezoresponse force microscopy.  United States.  doi:10.1063/1.4938482.

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                    Somnath, Suhas, Belianinov, Alex, Jesse, Stephen, and Kalinin, Sergei V. Mon .  
        "Full information acquisition in piezoresponse force microscopy".  United States.  doi:10.1063/1.4938482.  https://www.osti.gov/servlets/purl/1235834.

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@article{osti_1235834,

  title        = {Full information acquisition in piezoresponse force microscopy},

  author       = {Somnath, Suhas and Belianinov, Alex and Jesse, Stephen and Kalinin, Sergei V.},

  abstractNote = {The information flow from the tip-surface junction to the detector electronics during the piezoresponse force microscopy (PFM) imaging is explored using the recently developed general mode (G-mode) detection. Information-theory analysis suggests that G-mode PFM in the non-switching regime, close to the first resonance mode, contains a relatively small (100 - 150) number of components containing significant information. The first two primary components are similar to classical PFM images, suggesting that classical lock-in detection schemes provide high veracity information in this case. At the same time, a number of transient components exhibit contrast associated with surface topography, suggesting pathway to separate the two. The number of significant components increases considerably in the non-linear and switching regimes and approaching to cantilever resonances, precluding the use of classical lock-in detection and necessitating the use of band excitation or G-mode detection schemes. As a result, the future prospects of full information imaging in SPM are discussed.},

  doi          = {10.1063/1.4938482},

  journal      = {Applied Physics Letters},

  number       = 26,

  volume       = 107,

  place        = {United States},

  year         = {2015},

  month        = {12}

}

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DOI: 10.1063/1.4938482

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Works referenced in this record:

Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006

Bosman, M.; Watanabe, M.; Alexander, D. T. L.
Ultramicroscopy, Vol. 106, Issue 11-12, p. 1024-1032
DOI: 10.1016/j.ultramic.2006.04.016

High speed piezoresponse force microscopy: <1 frame per second nanoscale imaging
journal, August 2008

Nath, Ramesh; Chu, Ying-Hao; Polomoff, Nicholas A.
Applied Physics Letters, Vol. 93, Issue 7, Article No. 072905
DOI: 10.1063/1.2969045

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Abstract

Citation Formats

Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images journal, October 2006

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Mapping chemical and bonding information using multivariate analysis of electron energy-loss spectrum images
journal, October 2006

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journal, August 2008