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Title: Nucleation of fcc Ta when heating thin films

Thin tantalum films have been studied during in-situ heating in a transmission electron microscope. Diffraction patterns from the as-deposited films were typical of amorphous materials. Crystalline grains were observed to form when the specimen was annealed in-situ at 450°C. Particular attention was addressed to the formation and growth of grains with the face-centered cubic (fcc) crystal structure. As a result, these observations are discussed in relation to prior work on the formation of fcc Ta by deformation and during thin film deposition.
Authors:
 [1] ;  [2] ;  [3]
  1. Univ. of Connecticut, Storrs, CT (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  3. Univ. of Connecticut, Storrs, CT (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Publication Date:
Report Number(s):
SAND-2014-16009J
Journal ID: ISSN 1359-6462; PII: S1359646214004102
Grant/Contract Number:
AC04-94AL85000; DEAC04-94AL85000
Type:
Accepted Manuscript
Journal Name:
Scripta Materialia
Additional Journal Information:
Journal Volume: 96; Journal Issue: C; Journal ID: ISSN 1359-6462
Publisher:
Elsevier
Research Org:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English
Subject:
focused ion beam (FIB); high-resolution electron microscopy (HREM); transmission electron microscopy (TEM); crystal structure; tantalum
OSTI Identifier:
1235331
Alternate Identifier(s):
OSTI ID: 1432395

Janish, Matthew T., Mook, William M., and Carter, C. Barry. Nucleation of fcc Ta when heating thin films. United States: N. p., Web. doi:10.1016/j.scriptamat.2014.10.010.
Janish, Matthew T., Mook, William M., & Carter, C. Barry. Nucleation of fcc Ta when heating thin films. United States. doi:10.1016/j.scriptamat.2014.10.010.
Janish, Matthew T., Mook, William M., and Carter, C. Barry. 2014. "Nucleation of fcc Ta when heating thin films". United States. doi:10.1016/j.scriptamat.2014.10.010. https://www.osti.gov/servlets/purl/1235331.
@article{osti_1235331,
title = {Nucleation of fcc Ta when heating thin films},
author = {Janish, Matthew T. and Mook, William M. and Carter, C. Barry},
abstractNote = {Thin tantalum films have been studied during in-situ heating in a transmission electron microscope. Diffraction patterns from the as-deposited films were typical of amorphous materials. Crystalline grains were observed to form when the specimen was annealed in-situ at 450°C. Particular attention was addressed to the formation and growth of grains with the face-centered cubic (fcc) crystal structure. As a result, these observations are discussed in relation to prior work on the formation of fcc Ta by deformation and during thin film deposition.},
doi = {10.1016/j.scriptamat.2014.10.010},
journal = {Scripta Materialia},
number = C,
volume = 96,
place = {United States},
year = {2014},
month = {10}
}