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Title: Measuring single-shot, picosecond optical damage threshold in Ge, Si, and sapphire with a 5.1-μm laser

Abstract

Optical photonic structures driven by picosecond, GW-class lasers are emerging as promising novel sources of electron beams and high quality X-rays. Due to quadratic dependence on wavelength of the laser ponderomotive potential, the performance of such sources scales very favorably towards longer drive laser wavelengths. However, to take full advantage of photonic structures at mid-IR spectral region, it is important to determine optical breakdown limits of common optical materials. To this end, an experimental study was carried out at a wavelength of 5 µm, using a frequency-doubled CO 2 laser source, with 5 ps pulse length. Single-shot optical breakdowns were detected and characterized at different laser intensities, and damage threshold values of 0.2, 0.3, and 7.0 J/cm 2, were established for Ge, Si, and sapphire, respectively. As a result, the measured damage threshold values were stable and repeatable within individual data sets, and across varying experimental conditions.

Authors:
 [1];  [2];  [3];  [1];  [3];  [1];  [3];  [2];  [1]
  1. RadiaBeam Technologies, LLC, Santa Monica, CA (United States)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Univ. of California, Los Angeles, CA (United States)
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP) (SC-26)
OSTI Identifier:
1229525
Report Number(s):
BNL-111611-2015-JA
Journal ID: ISSN 2159-3930; R&D Project: KBCH139; KB0202011
Grant/Contract Number:  
SC00112704
Resource Type:
Accepted Manuscript
Journal Name:
Optical Materials Express
Additional Journal Information:
Journal Volume: 5; Journal Issue: 12; Journal ID: ISSN 2159-3930
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Agustsson, R., Pogorelsky, I., Arab, E., Murokh, A., O"Shea, B., Ovodenko, A., Rosenzweig, J., Solovyov, V., and Tilton, R. Measuring single-shot, picosecond optical damage threshold in Ge, Si, and sapphire with a 5.1-μm laser. United States: N. p., 2015. Web. doi:10.1364/OME.5.002835.
Agustsson, R., Pogorelsky, I., Arab, E., Murokh, A., O"Shea, B., Ovodenko, A., Rosenzweig, J., Solovyov, V., & Tilton, R. Measuring single-shot, picosecond optical damage threshold in Ge, Si, and sapphire with a 5.1-μm laser. United States. doi:10.1364/OME.5.002835.
Agustsson, R., Pogorelsky, I., Arab, E., Murokh, A., O"Shea, B., Ovodenko, A., Rosenzweig, J., Solovyov, V., and Tilton, R. Wed . "Measuring single-shot, picosecond optical damage threshold in Ge, Si, and sapphire with a 5.1-μm laser". United States. doi:10.1364/OME.5.002835. https://www.osti.gov/servlets/purl/1229525.
@article{osti_1229525,
title = {Measuring single-shot, picosecond optical damage threshold in Ge, Si, and sapphire with a 5.1-μm laser},
author = {Agustsson, R. and Pogorelsky, I. and Arab, E. and Murokh, A. and O"Shea, B. and Ovodenko, A. and Rosenzweig, J. and Solovyov, V. and Tilton, R.},
abstractNote = {Optical photonic structures driven by picosecond, GW-class lasers are emerging as promising novel sources of electron beams and high quality X-rays. Due to quadratic dependence on wavelength of the laser ponderomotive potential, the performance of such sources scales very favorably towards longer drive laser wavelengths. However, to take full advantage of photonic structures at mid-IR spectral region, it is important to determine optical breakdown limits of common optical materials. To this end, an experimental study was carried out at a wavelength of 5 µm, using a frequency-doubled CO2 laser source, with 5 ps pulse length. Single-shot optical breakdowns were detected and characterized at different laser intensities, and damage threshold values of 0.2, 0.3, and 7.0 J/cm2, were established for Ge, Si, and sapphire, respectively. As a result, the measured damage threshold values were stable and repeatable within individual data sets, and across varying experimental conditions.},
doi = {10.1364/OME.5.002835},
journal = {Optical Materials Express},
number = 12,
volume = 5,
place = {United States},
year = {2015},
month = {11}
}

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