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Title: Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films

Authors:
 [1];  [2];  [1]
  1. Baskin School of Engineering, University of California, Santa Cruz, California 95064, USA, Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA
  2. Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1228545
Grant/Contract Number:  
SC0001009
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 86 Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Favaloro, T., Bahk, J. -H., and Shakouri, A. Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films. United States: N. p., 2015. Web. doi:10.1063/1.4907354.
Favaloro, T., Bahk, J. -H., & Shakouri, A. Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films. United States. doi:10.1063/1.4907354.
Favaloro, T., Bahk, J. -H., and Shakouri, A. Fri . "Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films". United States. doi:10.1063/1.4907354.
@article{osti_1228545,
title = {Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films},
author = {Favaloro, T. and Bahk, J. -H. and Shakouri, A.},
abstractNote = {},
doi = {10.1063/1.4907354},
journal = {Review of Scientific Instruments},
number = 2,
volume = 86,
place = {United States},
year = {2015},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1063/1.4907354

Citation Metrics:
Cited by: 11 works
Citation information provided by
Web of Science

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