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Title: High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging

Authors:
 [1];  [1];  [1]; ORCiD logo [1];  [1]; ORCiD logo [1];  [1];  [1];  [1];  [2]
  1. Electrical Engineering Department, University of California, Los Angeles, California 90095, USA
  2. Electrical Engineering Department, University of California, Los Angeles, California 90095, USA, Bioengineering Department, University of California, Los Angeles, California 90095, USA, California NanoSystems Institute (CNSI), University of California, Los Angeles, California 90095, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1226738
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 106 Journal Issue: 15; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Luo, Wei, Shabbir, Faizan, Gong, Chao, Gulec, Cagatay, Pigeon, Jeremy, Shaw, Jessica, Greenbaum, Alon, Tochitsky, Sergei, Joshi, Chandrashekhar, and Ozcan, Aydogan. High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging. United States: N. p., 2015. Web. doi:10.1063/1.4918741.
Luo, Wei, Shabbir, Faizan, Gong, Chao, Gulec, Cagatay, Pigeon, Jeremy, Shaw, Jessica, Greenbaum, Alon, Tochitsky, Sergei, Joshi, Chandrashekhar, & Ozcan, Aydogan. High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging. United States. https://doi.org/10.1063/1.4918741
Luo, Wei, Shabbir, Faizan, Gong, Chao, Gulec, Cagatay, Pigeon, Jeremy, Shaw, Jessica, Greenbaum, Alon, Tochitsky, Sergei, Joshi, Chandrashekhar, and Ozcan, Aydogan. Thu . "High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging". United States. https://doi.org/10.1063/1.4918741.
@article{osti_1226738,
title = {High throughput on-chip analysis of high-energy charged particle tracks using lensfree imaging},
author = {Luo, Wei and Shabbir, Faizan and Gong, Chao and Gulec, Cagatay and Pigeon, Jeremy and Shaw, Jessica and Greenbaum, Alon and Tochitsky, Sergei and Joshi, Chandrashekhar and Ozcan, Aydogan},
abstractNote = {},
doi = {10.1063/1.4918741},
journal = {Applied Physics Letters},
number = 15,
volume = 106,
place = {United States},
year = {Thu Apr 16 00:00:00 EDT 2015},
month = {Thu Apr 16 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.4918741

Citation Metrics:
Cited by: 7 works
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