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Title: Sub-10 nm nanopantography

 [1];  [1];  [2];  [1]
  1. Plasma Processing Laboratory, Department of Chemical and Biomolecular Engineering, University of Houston, Houston, Texas 77204, USA
  2. Department of Electrical and Computer Engineering, University of Houston, Houston, Texas 77204, USA
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Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Name: Applied Physics Letters Journal Volume: 107 Journal Issue: 19; Journal ID: ISSN 0003-6951
American Institute of Physics
Country of Publication:
United States

Citation Formats

Tian, Siyuan, Donnelly, Vincent M., Ruchhoeft, Paul, and Economou, Demetre J. Sub-10 nm nanopantography. United States: N. p., 2015. Web. doi:10.1063/1.4935552.
Tian, Siyuan, Donnelly, Vincent M., Ruchhoeft, Paul, & Economou, Demetre J. Sub-10 nm nanopantography. United States. doi:
Tian, Siyuan, Donnelly, Vincent M., Ruchhoeft, Paul, and Economou, Demetre J. Fri . "Sub-10 nm nanopantography". United States. doi:
title = {Sub-10 nm nanopantography},
author = {Tian, Siyuan and Donnelly, Vincent M. and Ruchhoeft, Paul and Economou, Demetre J.},
abstractNote = {},
doi = {10.1063/1.4935552},
journal = {Applied Physics Letters},
number = 19,
volume = 107,
place = {United States},
year = {2015},
month = {11}

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