Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal

Shen, Xuan; Yamada, Tomoaki; Lin, Ruoqian; Kamo, Takafumi; Funakubo, Hiroshi; Wu, Di; Xin, Huolin L.; Su, Dong

doi:10.1063/1.4932953

Title: Interfacial dislocations in (111) oriented (Ba_0.7Sr_0.3)TiO₃ films on SrTiO₃ single crystal

Abstract

In this study, we have investigated the interfacial structure of epitaxial (Ba,Sr)TiO₃ films grown on (111)-oriented SrTiO₃ single-crystal substrates using transmission electron microscopy (TEM) techniques. Compared with the (100) epitaxial perovskite films, we observe dominant dislocation half-loop with Burgers vectors of a<110> comprised of a misfit dislocation along <112>, and threading dislocations along <110> or <100>. The misfit dislocation with Burgers vector of a <110> can dissociate into two ½ a <110> partial dislocations and one stacking fault. We found the dislocation reactions occur not only between misfit dislocations, but also between threading dislocations. Via three-dimensional electron tomography, we retrieved the configurations of the threading dislocation reactions. The reactions between threading dislocations lead to a more efficient strain relaxation than do the misfit dislocations alone in the near-interface region of the (111)-oriented (Ba_0.7Sr_0.3)TiO₃ films.

Authors:

Shen, Xuan ^[1]; Yamada, Tomoaki ^[2]; Lin, Ruoqian ^[3]; Kamo, Takafumi ^[4]; Funakubo, Hiroshi ^[4];

^[5]; Xin, Huolin L. ^[3];

^[3]

Nanjing Univ., Nanjing (China); Brookhaven National Lab., Upton, NY (United States)
Nagoya Univ., Nagoya (Japan); Japan Science and Technology Agency, Saitama (Japan); Tokyo Institute of Technology, Yokohama (Japan)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Tokyo Institute of Technology, Yokohama (Japan)
Nanjing Univ., Nanjing (China)

Publication Date:: Thu Oct 08 00:00:00 EDT 2015

Research Org.:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1224766

Report Number(s):: BNL-108487-2015-JA
Journal ID: ISSN 0003-6951; APPLAB; KC0403020

Grant/Contract Number:: SC00112704

Resource Type:: Accepted Manuscript

Journal Name:: Applied Physics Letters

Additional Journal Information:: Journal Volume: 107; Journal Issue: 14; Journal ID: ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

Subject:: 29 ENERGY PLANNING, POLICY, AND ECONOMY; (Ba_0.7Sr_0.3)TiO₃; interfacial dislocations; STEM; Center for Functional Nanomaterials; dislocations; epitaxy; thin film structure; dielectric thin films; stacking faults

Citation Formats


                    Shen, Xuan, Yamada, Tomoaki, Lin, Ruoqian, Kamo, Takafumi, Funakubo, Hiroshi, Wu, Di, Xin, Huolin L., and Su, Dong. Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal.  United States: N. p., 2015. 
Web.  doi:10.1063/1.4932953.

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                    Shen, Xuan, Yamada, Tomoaki, Lin, Ruoqian, Kamo, Takafumi, Funakubo, Hiroshi, Wu, Di, Xin, Huolin L., & Su, Dong. Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal.  United States.  https://doi.org/10.1063/1.4932953

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                    Shen, Xuan, Yamada, Tomoaki, Lin, Ruoqian, Kamo, Takafumi, Funakubo, Hiroshi, Wu, Di, Xin, Huolin L., and Su, Dong. Thu .  
"Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal".  United States.  https://doi.org/10.1063/1.4932953.  https://www.osti.gov/servlets/purl/1224766.

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@article{osti_1224766,

  title        = {Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal},

  author       = {Shen, Xuan and Yamada, Tomoaki and Lin, Ruoqian and Kamo, Takafumi and Funakubo, Hiroshi and Wu, Di and Xin, Huolin L. and Su, Dong},

  abstractNote = {In this study, we have investigated the interfacial structure of epitaxial (Ba,Sr)TiO3 films grown on (111)-oriented SrTiO3 single-crystal substrates using transmission electron microscopy (TEM) techniques. Compared with the (100) epitaxial perovskite films, we observe dominant dislocation half-loop with Burgers vectors of a<110> comprised of a misfit dislocation along <112>, and threading dislocations along <110> or <100>. The misfit dislocation with Burgers vector of a <110> can dissociate into two ½ a <110> partial dislocations and one stacking fault. We found the dislocation reactions occur not only between misfit dislocations, but also between threading dislocations. Via three-dimensional electron tomography, we retrieved the configurations of the threading dislocation reactions. The reactions between threading dislocations lead to a more efficient strain relaxation than do the misfit dislocations alone in the near-interface region of the (111)-oriented (Ba0.7Sr0.3)TiO3 films.},

  doi          = {10.1063/1.4932953},

  journal      = {Applied Physics Letters},

  number       = 14,

  volume       = 107,

  place        = {United States},

  year         = {Thu Oct 08 00:00:00 EDT 2015},

  month        = {Thu Oct 08 00:00:00 EDT 2015}

}

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Works referenced in this record:

Origin of the dielectric dead layer in nanoscale capacitors
journal, October 2006

Stengel, Massimiliano; Spaldin, Nicola A.
Nature, Vol. 443, Issue 7112
DOI: 10.1038/nature05148

Impact of misfit dislocations on the polarization instability of epitaxial nanostructured ferroelectric perovskites
journal, January 2004

Chu, Ming-Wen; Szafraniak, Izabela; Scholz, Roland
Nature Materials, Vol. 3, Issue 2
DOI: 10.1038/nmat1057

Soft mode behavior in SrTiO3/DyScO3 thin films: Evidence of ferroelectric and antiferrodistortive phase transitions
journal, December 2009

Nuzhnyy, D.; Petzelt, J.; Kamba, S.
Applied Physics Letters, Vol. 95, Issue 23
DOI: 10.1063/1.3271179

Annealing effect on dislocations in SrTiO3∕LaAlO3 heterostructures
journal, March 2007

Su, Dong; Yamada, Tomoaki; Sherman, Vladimir O.
Journal of Applied Physics, Vol. 101, Issue 6
DOI: 10.1063/1.2710281

Atomic structure of Ba0.5Sr0.5TiO3 thin films on LaAlO3
journal, October 1999

Gao, H. -J.; Chen, C. L.; Rafferty, B.
Applied Physics Letters, Vol. 75, Issue 17
DOI: 10.1063/1.125071

Misfit dislocation walls in solid films
journal, August 1999

Ovid'ko, I. A.
Journal of Physics: Condensed Matter, Vol. 11, Issue 34
DOI: 10.1088/0953-8984/11/34/304

Structural evolution of dislocation half-loops in epitaxial BaTiO3 thin films during high-temperature annealing
journal, September 2004

Sun, H. P.; Pan, X. Q.; Haeni, J. H.
Applied Physics Letters, Vol. 85, Issue 11
DOI: 10.1063/1.1789233

Structural and dielectric properties of strain-controlled epitaxial SrTiO3 thin films by two-step growth technique
journal, September 2005

Yamada, Tomoaki; Astafiev, Konstantin F.; Sherman, Vladimir O.
Journal of Applied Physics, Vol. 98, Issue 5
DOI: 10.1063/1.2037211

Analysis of misfit relaxation in heteroepitaxial BaTiO ₃ thin films
journal, October 1999

Suzuki, Toshimasa; Nishi, Yuji; Fujimoto, Masayuki
Philosophical Magazine A, Vol. 79, Issue 10
DOI: 10.1080/01418619908214294

Ferroelectric and antiferroelectric coupling in superlattices of paraelectric perovskites at room temperature
journal, July 2003

Christen, Hans M.; Specht, Eliot D.; Silliman, Sherwood S.
Physical Review B, Vol. 68, Issue 2
DOI: 10.1103/PhysRevB.68.020101

Epitaxial growth and dielectric properties of (111) oriented BaTiO3/SrTiO3 superlattices by pulsed-laser deposition
journal, November 2000

Nakagawara, Osamu; Shimuta, Toru; Makino, Takahiro
Applied Physics Letters, Vol. 77, Issue 20
DOI: 10.1063/1.1324985

Pressure-induced crossover from long-to-short-range order in [Pb(Zn1/3Nb2/3)O3]0.905(PbTiO3)0.095 single crystal
journal, March 2000

Samara, G. A.; Venturini, E. L.; Schmidt, V. Hugo
Applied Physics Letters, Vol. 76, Issue 10
DOI: 10.1063/1.126024

Dissociation and evolution of threading dislocations in epitaxial Ba0.3Sr0.7TiO3 thin films grown on (001) LaAlO3
journal, January 2003

Lu, C. J.; Bendersky, L. A.; Chang, K.
Journal of Applied Physics, Vol. 93, Issue 1
DOI: 10.1063/1.1524315

Tuning of direct current bias-induced resonances in micromachined Ba0.3Sr0.7TiO3 thin-film capacitors
journal, December 2007

Noeth, Andreas; Yamada, Tomoaki; Sherman, Vladimir O.
Journal of Applied Physics, Vol. 102, Issue 11
DOI: 10.1063/1.2822203

High-resolution identification of ½⟨110⟩ stacking faults in epitaxial Ba _0.3 Sr _0.7 TiO ₃ thin films
journal, January 2003

Lu, C. J.; Bendersky, L. A.; Chang, K.
Philosophical Magazine, Vol. 83, Issue 13
DOI: 10.1080/1478643031000081284

Ferroelectric thin films: Review of materials, properties, and applications
journal, September 2006

Setter, N.; Damjanovic, D.; Eng, L.
Journal of Applied Physics, Vol. 100, Issue 5
DOI: 10.1063/1.2336999

Effective elastic properties for unpoled barium titanate
journal, January 2007

Dent, A. C.; Bowen, C. R.; Stevens, R.
Journal of the European Ceramic Society, Vol. 27, Issue 13-15
DOI: 10.1016/j.jeurceramsoc.2007.02.031

Movement of Dislocations
book, February 2011

Hull, D.; Bacon, D. J.
Introduction to Dislocations
DOI: 10.1016/B978-0-08-096672-4.00003-7

Dependence of dielectric properties on internal stresses in epitaxial barium strontium titanate thin films
journal, April 2001

Li, Hao; Roytburd, A. L.; Alpay, S. P.
Applied Physics Letters, Vol. 78, Issue 16
DOI: 10.1063/1.1359141

Effects of very thin strain layers on dielectric properties of epitaxial Ba0.6Sr0.4TiO3 films
journal, January 2001

Park, B. H.; Peterson, E. J.; Jia, Q. X.
Applied Physics Letters, Vol. 78, Issue 4
DOI: 10.1063/1.1340863

Optimization of the tunability of barium strontium titanate films via epitaxial stresses
journal, January 2003

Ban, Z. -G.; Alpay, S. P.
Journal of Applied Physics, Vol. 93, Issue 1
DOI: 10.1063/1.1524310

Calculation of critical layer thickness versus lattice mismatch for Ge _x Si _{1− x} /Si strained‐layer heterostructures
journal, August 1985

People, R.; Bean, J. C.
Applied Physics Letters, Vol. 47, Issue 3
DOI: 10.1063/1.96206

Phase diagrams and dielectric response of epitaxial barium strontium titanate films: A theoretical analysis
journal, June 2002

Ban, Z. -G.; Alpay, S. P.
Journal of Applied Physics, Vol. 91, Issue 11
DOI: 10.1063/1.1473675

Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effect of internal stresses and dislocation-type defects
journal, September 2000

Canedy, C. L.; Li, Hao; Alpay, S. P.
Applied Physics Letters, Vol. 77, Issue 11
DOI: 10.1063/1.1308531

Misfit dislocations in nanoscale ferroelectric heterostructures
journal, May 2005

Nagarajan, V.; Jia, C. L.; Kohlstedt, H.
Applied Physics Letters, Vol. 86, Issue 19
DOI: 10.1063/1.1922579

Origin of 90° domain wall pinning in Pb(Zr _0.2 Ti _0.8 )O ₃ heteroepitaxial thin films
journal, September 2011

Su, Dong; Meng, Qingping; Vaz, C. A. F.
Applied Physics Letters, Vol. 99, Issue 10
DOI: 10.1063/1.3634028

Study of Microstructure in SrTiO ₃ /Si by High-resolution Transmission Electron Microscopy
journal, January 2002

Yang, G. Y.; Finder, J. M.; Wang, J.
Journal of Materials Research, Vol. 17, Issue 1
DOI: 10.1557/JMR.2002.0030

Growth-mode induced defects in epitaxial SrTiO ₃ thin films grown on single crystal LaAlO ₃ by a two-step PLD process
journal, March 2011

Su, Dong; Yamada, Tomoaki; Gysel, Roman
Journal of Materials Research, Vol. 26, Issue 6
DOI: 10.1557/jmr.2010.82

Transitions from Near-Surface to Interior Redox upon Lithiation in Conversion Electrode Materials
journal, January 2015

He, Kai; Xin, Huolin L.; Zhao, Kejie
Nano Letters, Vol. 15, Issue 2
DOI: 10.1021/nl5049884

Strong growth orientation dependence of strain relaxation in epitaxial (Ba,Sr)TiO ₃ films and the resulting dielectric properties
journal, May 2011

Yamada, Tomoaki; Kamo, Takafumi; Funakubo, Hiroshi
Journal of Applied Physics, Vol. 109, Issue 9
DOI: 10.1063/1.3581203

Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography
journal, October 2006

Barnard, J. S.; Sharp, J.; Tong, J. R.
Philosophical Magazine, Vol. 86, Issue 29-31
DOI: 10.1080/14786430600798839

Dislocations in SrTiO ₃ thin films grown on LaAlO ₃ substrates
journal, December 2002

Qin, Y. L.; Jia, C. L.; Urban, K.
Journal of Materials Research, Vol. 17, Issue 12
DOI: 10.1557/JMR.2002.0451

Interfacial structure in epitaxial perovskite oxides on (001) Ge crystal
journal, January 2015

Shen, Xuan; Ahmadi-Majlan, K.; Ngai, Joseph H.
Applied Physics Letters, Vol. 106, Issue 3
DOI: 10.1063/1.4906430

In situ high-resolution transmission electron microscopy of dislocation formation and dynamics during the crystallization of amorphous SrTiO3
journal, April 2005

Lee, Sung Bo; Sigle, Wilfried; Phillipp, Fritz
Acta Materialia, Vol. 53, Issue 6
DOI: 10.1016/j.actamat.2004.12.034

Works referencing / citing this record:

Misfit strain relaxations of (101)-oriented ferroelectric PbTiO ₃ /(La, Sr)(Al, Ta)O ₃ thin film systems
journal, December 2018

Feng, Yanpeng; Tang, Yunlong; Zhu, Yinlian
Journal of Materials Research, Vol. 33, Issue 24
DOI: 10.1557/jmr.2018.422

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Title: Interfacial dislocations in (111) oriented (Ba0.7Sr0.3)TiO3 films on SrTiO3 single crystal

Abstract

Citation Formats

Origin of the dielectric dead layer in nanoscale capacitors journal, October 2006

Impact of misfit dislocations on the polarization instability of epitaxial nanostructured ferroelectric perovskites journal, January 2004

Soft mode behavior in SrTiO3/DyScO3 thin films: Evidence of ferroelectric and antiferrodistortive phase transitions journal, December 2009

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Structural and dielectric properties of strain-controlled epitaxial SrTiO3 thin films by two-step growth technique journal, September 2005

Analysis of misfit relaxation in heteroepitaxial BaTiO 3 thin films journal, October 1999

Ferroelectric and antiferroelectric coupling in superlattices of paraelectric perovskites at room temperature journal, July 2003

Epitaxial growth and dielectric properties of (111) oriented BaTiO3/SrTiO3 superlattices by pulsed-laser deposition journal, November 2000

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Effective elastic properties for unpoled barium titanate journal, January 2007

Movement of Dislocations book, February 2011

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Dislocations in SrTiO 3 thin films grown on LaAlO 3 substrates journal, December 2002

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Title: Interfacial dislocations in (111) oriented (Ba_0.7Sr_0.3)TiO₃ films on SrTiO₃ single crystal

Origin of the dielectric dead layer in nanoscale capacitors
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Soft mode behavior in SrTiO3/DyScO3 thin films: Evidence of ferroelectric and antiferrodistortive phase transitions
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Annealing effect on dislocations in SrTiO3∕LaAlO3 heterostructures
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Atomic structure of Ba0.5Sr0.5TiO3 thin films on LaAlO3
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Misfit dislocation walls in solid films
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Structural evolution of dislocation half-loops in epitaxial BaTiO3 thin films during high-temperature annealing
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Analysis of misfit relaxation in heteroepitaxial BaTiO ₃ thin films
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journal, November 2000

Pressure-induced crossover from long-to-short-range order in [Pb(Zn1/3Nb2/3)O3]0.905(PbTiO3)0.095 single crystal
journal, March 2000

Dissociation and evolution of threading dislocations in epitaxial Ba0.3Sr0.7TiO3 thin films grown on (001) LaAlO3
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Effective elastic properties for unpoled barium titanate
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Movement of Dislocations
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Dependence of dielectric properties on internal stresses in epitaxial barium strontium titanate thin films
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Effects of very thin strain layers on dielectric properties of epitaxial Ba0.6Sr0.4TiO3 films
journal, January 2001

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Calculation of critical layer thickness versus lattice mismatch for Ge _x Si _{1− x} /Si strained‐layer heterostructures
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Origin of 90° domain wall pinning in Pb(Zr _0.2 Ti _0.8 )O ₃ heteroepitaxial thin films
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Study of Microstructure in SrTiO ₃ /Si by High-resolution Transmission Electron Microscopy
journal, January 2002

Growth-mode induced defects in epitaxial SrTiO ₃ thin films grown on single crystal LaAlO ₃ by a two-step PLD process
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Transitions from Near-Surface to Interior Redox upon Lithiation in Conversion Electrode Materials
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Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography
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Dislocations in SrTiO ₃ thin films grown on LaAlO ₃ substrates
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In situ high-resolution transmission electron microscopy of dislocation formation and dynamics during the crystallization of amorphous SrTiO3
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