skip to main content


Title: X-ray Moiré deflectometry using synthetic reference images

Moiré fringe deflectometry with grating interferometers is a technique that enables refraction-based x-ray imaging using a single exposure of an object. To obtain the refraction image, the method requires a reference fringe pattern (without the object). Our study shows that, in order to avoid artifacts, the reference pattern must be exactly matched in phase with the object fringe pattern. In experiments, however, it is difficult to produce a perfectly matched reference pattern due to unavoidable interferometer drifts. We present a simple method to obtain matched reference patterns using a phase-scan procedure to generate synthetic Moiré images. As a result, the method will enable deflectometric diagnostics of transient phenomena such as laser-produced plasmas and could improve the sensitivity and accuracy of medical phase-contrast imaging.
 [1] ;  [1] ;  [1]
  1. Johns Hopkins Univ., Baltimore, MD (United States)
Publication Date:
Grant/Contract Number:
NA0001835; DENA0001B35
Accepted Manuscript
Journal Name:
Applied Optics
Additional Journal Information:
Journal Volume: 54; Journal Issue: 19; Journal ID: ISSN 0003-6935
Optical Society of America (OSA)
Research Org:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; X-ray interferometry; phase retrieval; X-ray imaging
OSTI Identifier:
Alternate Identifier(s):
OSTI ID: 1222257