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Title: Broadband extreme ultraviolet probing of transient gratings in vanadium dioxide

Nonlinear spectroscopy in the extreme ultraviolet (EUV) and soft x-ray spectral range offers the opportunity for element selective probing of ultrafast dynamics using core-valence transitions (Mukamel et al., Acc. Chem. Res. 42, 553 (2009)). The study demonstrate a step on this path showing core-valence sensitivity in transient grating spectroscopy with EUV probing. We study the optically induced insulator-to-metal transition (IMT) of a VO2 film with EUV diffraction from the optically excited sample. The VO2 exhibits a change in the 3p-3d resonance of V accompanied by an acoustic response. Due to the broadband probing we are able to separate the two features.
Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [4] ;  [2] ;  [5] ;  [2]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States); Lawrence Livermore National Lab., Livermore, CA (United States)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. IBM Almaden Research Center, San Jose, CA (United States)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States); Temple Univ., Philadelphia, PA (United States)
  5. IBM Almaden Research Center, San Jose, CA (United States); Max Planck Institute of Microstructure Physics, Halle (Germany)
Publication Date:
Report Number(s):
LLNL-JRNL-686931
Journal ID: ISSN 1094-4087; OPEXFF
Grant/Contract Number:
NA; AC52-07NA27344
Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 23; Journal Issue: 4; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ultrafast spectroscopy; X-rays; soft x0rays; extreme ultraviolet (EUV); dynamic gratings; ultrafast processes in condensed matter, including semiconductors; 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; x-rays; soft x-rays; EUV
OSTI Identifier:
1222324
Alternate Identifier(s):
OSTI ID: 1222960; OSTI ID: 1260482