Performance of bent-crystal x-ray microscopes for high energy density physics research
Abstract
We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. Furthermore, the analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. We discovered that this enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.
- Authors:
-
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1235279
- Alternate Identifier(s):
- OSTI ID: 1222278
- Report Number(s):
- SAND-2015-3775J
Journal ID: ISSN 0003-6935; APOPAI; 583836
- Grant/Contract Number:
- AC04-94AL85000; AC04- 94AL85000
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Optics
- Additional Journal Information:
- Journal Volume: 54; Journal Issue: 16; Journal ID: ISSN 0003-6935
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 73 NUCLEAR PHYSICS AND RADIATION PHYSICS
Citation Formats
Schollmeier, Marius S., Geissel, Matthias, Shores, Jonathon E., Smith, Ian C., and Porter, John L. Performance of bent-crystal x-ray microscopes for high energy density physics research. United States: N. p., 2015.
Web. doi:10.1364/AO.54.005147.
Schollmeier, Marius S., Geissel, Matthias, Shores, Jonathon E., Smith, Ian C., & Porter, John L. Performance of bent-crystal x-ray microscopes for high energy density physics research. United States. https://doi.org/10.1364/AO.54.005147
Schollmeier, Marius S., Geissel, Matthias, Shores, Jonathon E., Smith, Ian C., and Porter, John L. Fri .
"Performance of bent-crystal x-ray microscopes for high energy density physics research". United States. https://doi.org/10.1364/AO.54.005147. https://www.osti.gov/servlets/purl/1235279.
@article{osti_1235279,
title = {Performance of bent-crystal x-ray microscopes for high energy density physics research},
author = {Schollmeier, Marius S. and Geissel, Matthias and Shores, Jonathon E. and Smith, Ian C. and Porter, John L.},
abstractNote = {We present calculations for the field of view (FOV), image fluence, image monochromaticity, spectral acceptance, and image aberrations for spherical crystal microscopes, which are used as self-emission imaging or backlighter systems at large-scale high energy density physics facilities. Our analytic results are benchmarked with ray-tracing calculations as well as with experimental measurements from the 6.151 keV backlighter system at Sandia National Laboratories. Furthermore, the analytic expressions can be used for x-ray source positions anywhere between the Rowland circle and object plane. We discovered that this enables quick optimization of the performance of proposed but untested, bent-crystal microscope systems to find the best compromise between FOV, image fluence, and spatial resolution for a particular application.},
doi = {10.1364/AO.54.005147},
journal = {Applied Optics},
number = 16,
volume = 54,
place = {United States},
year = {Fri May 29 00:00:00 EDT 2015},
month = {Fri May 29 00:00:00 EDT 2015}
}
Web of Science
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