Efficient modeling of Bragg coherent x-ray nanobeam diffraction
Abstract
X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. In this paper, we use a Fourier-transform-based method of modeling the 2D intensity distribution of a Bragg peak and apply it to the case of thin films illuminated with a Fresnel zone plate in three different Bragg scattering geometries. Finally, the calculations agree well with experimental coherent diffraction patterns, demonstrating that nanodiffraction patterns can be modeled at nonsymmetric Bragg conditions with this approach—a capability critical for advancing nanofocused x-ray diffraction microscopy.
- Authors:
-
- Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
- Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
- Aix-Marseille Univ., Marseille (France). CNRS. Fresnel Inst.
- Columbia Univ., New York, NY (United States). Dept. of Applied Physics and Mathematics
- Thomas J. Watson Research Center, Yorktown Heights, NY (United States). IBM Corporation
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States); Aix-Marseille Univ., Marseille (France)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Agency for Research (ANR) (France)
- Contributing Org.:
- Columbia Univ., New York, NY (United States); Thomas J. Watson Research Center, Yorktown Heights, NY (United States)
- OSTI Identifier:
- 1356646
- Alternate Identifier(s):
- OSTI ID: 1222258
- Grant/Contract Number:
- AC02-06CH11357; ANR-11-BS10-0005
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Optics Letters
- Additional Journal Information:
- Journal Volume: 40; Journal Issue: 14; Journal ID: ISSN 0146-9592
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Diffractive optics; Far field diffraction; High numerical aperture optics; Ptychography; Scanning probe microscopy; X ray optics; Coherence; Synchrotron radiation
Citation Formats
Hruszkewycz, S. O., Holt, M. V., Allain, M., Chamard, V., Polvino, S. M., Murray, C. E., and Fuoss, P. H. Efficient modeling of Bragg coherent x-ray nanobeam diffraction. United States: N. p., 2015.
Web. doi:10.1364/OL.40.003241.
Hruszkewycz, S. O., Holt, M. V., Allain, M., Chamard, V., Polvino, S. M., Murray, C. E., & Fuoss, P. H. Efficient modeling of Bragg coherent x-ray nanobeam diffraction. United States. https://doi.org/10.1364/OL.40.003241
Hruszkewycz, S. O., Holt, M. V., Allain, M., Chamard, V., Polvino, S. M., Murray, C. E., and Fuoss, P. H. Thu .
"Efficient modeling of Bragg coherent x-ray nanobeam diffraction". United States. https://doi.org/10.1364/OL.40.003241. https://www.osti.gov/servlets/purl/1356646.
@article{osti_1356646,
title = {Efficient modeling of Bragg coherent x-ray nanobeam diffraction},
author = {Hruszkewycz, S. O. and Holt, M. V. and Allain, M. and Chamard, V. and Polvino, S. M. and Murray, C. E. and Fuoss, P. H.},
abstractNote = {X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. In this paper, we use a Fourier-transform-based method of modeling the 2D intensity distribution of a Bragg peak and apply it to the case of thin films illuminated with a Fresnel zone plate in three different Bragg scattering geometries. Finally, the calculations agree well with experimental coherent diffraction patterns, demonstrating that nanodiffraction patterns can be modeled at nonsymmetric Bragg conditions with this approach—a capability critical for advancing nanofocused x-ray diffraction microscopy.},
doi = {10.1364/OL.40.003241},
journal = {Optics Letters},
number = 14,
volume = 40,
place = {United States},
year = {Thu Jul 02 00:00:00 EDT 2015},
month = {Thu Jul 02 00:00:00 EDT 2015}
}
Web of Science
Works referenced in this record:
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Works referencing / citing this record:
High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography
journal, November 2016
- Hruszkewycz, S. O.; Allain, M.; Holt, M. V.
- Nature Materials, Vol. 16, Issue 2
Imaging nanoscale lattice variations by machine learning of x-ray diffraction microscopy data
journal, August 2016
- Laanait, Nouamane; Zhang, Zhan; Schlepütz, Christian M.
- Nanotechnology, Vol. 27, Issue 37